Design of on-chip monitoring circuits for clock delay and temperature
Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2016.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2016
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| Online Access: | http://hdl.handle.net/1721.1/105997 |
| _version_ | 1826205515418435584 |
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| author | Kakuru, George Bamuturaki |
| author2 | Charles G. Sodini, Jeremy Walker, and Andrew Lewine. |
| author_facet | Charles G. Sodini, Jeremy Walker, and Andrew Lewine. Kakuru, George Bamuturaki |
| author_sort | Kakuru, George Bamuturaki |
| collection | MIT |
| description | Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2016. |
| first_indexed | 2024-09-23T13:14:17Z |
| format | Thesis |
| id | mit-1721.1/105997 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T13:14:17Z |
| publishDate | 2016 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/1059972019-04-12T17:18:44Z Design of on-chip monitoring circuits for clock delay and temperature Kakuru, George Bamuturaki Charles G. Sodini, Jeremy Walker, and Andrew Lewine. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2016. This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections. Cataloged from student-submitted PDF version of thesis. Includes bibliographical references (pages 81-82). As devices continue to scale, Process, Voltage and Temperature (PVT) variations tend to have a bigger impact on circuit performance. The ability to measure this impact provides essential knowledge about the circuit's current performance and opens the door to compensation techniques. Off-chip measurement circuits are usually of limited bandwidth and load the measured circuit, thus affecting the measurement result. Onchip circuits on the other hand have the potential for high bandwidth and, if designed well, have small area and can be incorporated into different parts of the chip. For this project a delay and temperature measurement circuit is designed. The delay measurement circuit relies on a method called Code Density Test (CDT), a statistical method which involves counting the number of asynchronous edges that occur within the relative delay of two synchronous clocks. The temperature measurement circuit converts temperature to a delay which can then be measured by the CDT circuit. by George Bamuturaki Kakuru. M. Eng. 2016-12-22T15:17:57Z 2016-12-22T15:17:57Z 2016 2016 Thesis http://hdl.handle.net/1721.1/105997 965798463 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 82 pages application/pdf Massachusetts Institute of Technology |
| spellingShingle | Electrical Engineering and Computer Science. Kakuru, George Bamuturaki Design of on-chip monitoring circuits for clock delay and temperature |
| title | Design of on-chip monitoring circuits for clock delay and temperature |
| title_full | Design of on-chip monitoring circuits for clock delay and temperature |
| title_fullStr | Design of on-chip monitoring circuits for clock delay and temperature |
| title_full_unstemmed | Design of on-chip monitoring circuits for clock delay and temperature |
| title_short | Design of on-chip monitoring circuits for clock delay and temperature |
| title_sort | design of on chip monitoring circuits for clock delay and temperature |
| topic | Electrical Engineering and Computer Science. |
| url | http://hdl.handle.net/1721.1/105997 |
| work_keys_str_mv | AT kakurugeorgebamuturaki designofonchipmonitoringcircuitsforclockdelayandtemperature |