Creation, validation, and implementation of a Highly Accelerated Life Testing (HALT) procedure to improve the reliability of printed circuit boards

Thesis: M. Eng. in Advanced Manufacturing and Design, Massachusetts Institute of Technology, Department of Mechanical Engineering, 2016.

Bibliographic Details
Main Author: Singh, Abhishek, M. Eng. Massachusetts Institute of Technology
Other Authors: David E. Hardt.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2017
Subjects:
Online Access:http://hdl.handle.net/1721.1/107079
Description
Summary:Thesis: M. Eng. in Advanced Manufacturing and Design, Massachusetts Institute of Technology, Department of Mechanical Engineering, 2016.