A nanofabricated amplitude-division electron interferometer in a transmission electron microscope
Thesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2016.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2017
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| Online Access: | http://hdl.handle.net/1721.1/107101 |
| _version_ | 1826191986580783104 |
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| author | Agarwal, Akshay |
| author2 | Karl K. Berggren. |
| author_facet | Karl K. Berggren. Agarwal, Akshay |
| author_sort | Agarwal, Akshay |
| collection | MIT |
| description | Thesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2016. |
| first_indexed | 2024-09-23T09:04:25Z |
| format | Thesis |
| id | mit-1721.1/107101 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T09:04:25Z |
| publishDate | 2017 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/1071012019-04-10T20:36:28Z A nanofabricated amplitude-division electron interferometer in a transmission electron microscope Agarwal, Akshay Karl K. Berggren. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2016. "September 2016." Cataloged from PDF version of thesis. Includes bibliographical references (pages 56-62). Wavefront-division electron interferometry with the electron biprism has enabled many applications such as electron holography, exit-wave reconstruction, and demonstration of the Aharonov-Bohm effect. However, wavefront-division interferometry is limited by the requirement of high source coherence. Amplitude-division electron interferometers, first demonstrated by Marton and co-workers in 1954, can overcome this limitation. The implementation of these interferometers is hindered by the precise rotational and translational alignment required. This thesis develops a self-aligned, monolithic electron interferometer consisting of two 45 nm thick silicon layers separated by 20 gm and fabricated from a single crystal silicon cantilever on a transmission electron microscope grid by gallium focused ion-beam milling. Using this interferometer, beam path-separation and interference fringes of lattice periodicity and a maximum contrast of 15% in an unmodified 200 kV transmission electron microscope was demonstrated. This interferometer design can potentially be scaled to millimeter-scale and used in electron holography. It can also be applied to perform fundamental physics experiments such as interaction-free measurement with electrons, with the aim of significantly reducing the damage suffered by biological samples during high-resolution microscopy. Thus, the interferometer can serve as a proof-of-concept of the recently proposed 'Quantum Electron Microscope'. by Akshay Agarwal. S.M. 2017-02-22T19:03:35Z 2017-02-22T19:03:35Z 2016 Thesis http://hdl.handle.net/1721.1/107101 971483031 eng MIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission. http://dspace.mit.edu/handle/1721.1/7582 62 pages application/pdf Massachusetts Institute of Technology |
| spellingShingle | Electrical Engineering and Computer Science. Agarwal, Akshay A nanofabricated amplitude-division electron interferometer in a transmission electron microscope |
| title | A nanofabricated amplitude-division electron interferometer in a transmission electron microscope |
| title_full | A nanofabricated amplitude-division electron interferometer in a transmission electron microscope |
| title_fullStr | A nanofabricated amplitude-division electron interferometer in a transmission electron microscope |
| title_full_unstemmed | A nanofabricated amplitude-division electron interferometer in a transmission electron microscope |
| title_short | A nanofabricated amplitude-division electron interferometer in a transmission electron microscope |
| title_sort | nanofabricated amplitude division electron interferometer in a transmission electron microscope |
| topic | Electrical Engineering and Computer Science. |
| url | http://hdl.handle.net/1721.1/107101 |
| work_keys_str_mv | AT agarwalakshay ananofabricatedamplitudedivisionelectroninterferometerinatransmissionelectronmicroscope AT agarwalakshay nanofabricatedamplitudedivisionelectroninterferometerinatransmissionelectronmicroscope |