Myers, M. P., & Anant Balakrishnan, J. G. K. (2005). Improving production testing of RF products in a noisy measurement environment. Massachusetts Institute of Technology.
Chicago Style (17th ed.) CitationMyers, M. Parker, and John G. Kassakian Anant Balakrishnan. Improving Production Testing of RF Products in a Noisy Measurement Environment. Massachusetts Institute of Technology, 2005.
MLA (9th ed.) CitationMyers, M. Parker, and John G. Kassakian Anant Balakrishnan. Improving Production Testing of RF Products in a Noisy Measurement Environment. Massachusetts Institute of Technology, 2005.
Warning: These citations may not always be 100% accurate.