Improving production testing of RF products in a noisy measurement environment
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2005
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| Online Access: | http://hdl.handle.net/1721.1/10942 |
| _version_ | 1826201656794021888 |
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| author | Myers, M. Parker (Marion Parker) |
| author2 | Anant Balakrishnan, John G. Kassakian. |
| author_facet | Anant Balakrishnan, John G. Kassakian. Myers, M. Parker (Marion Parker) |
| author_sort | Myers, M. Parker (Marion Parker) |
| collection | MIT |
| description | Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996. |
| first_indexed | 2024-09-23T11:55:03Z |
| format | Thesis |
| id | mit-1721.1/10942 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T11:55:03Z |
| publishDate | 2005 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/109422019-04-10T22:15:39Z Improving production testing of RF products in a noisy measurement environment Myers, M. Parker (Marion Parker) Anant Balakrishnan, John G. Kassakian. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science Sloan School of Management Sloan School of Management Electrical Engineering and Computer Science Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996. Includes bibliographical references (leaf 60). by M. Parker Myers. M.S. 2005-08-18T15:26:11Z 2005-08-18T15:26:11Z 1996 1996 Thesis http://hdl.handle.net/1721.1/10942 35748415 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 60 leaves 4505077 bytes 4504834 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology |
| spellingShingle | Sloan School of Management Electrical Engineering and Computer Science Myers, M. Parker (Marion Parker) Improving production testing of RF products in a noisy measurement environment |
| title | Improving production testing of RF products in a noisy measurement environment |
| title_full | Improving production testing of RF products in a noisy measurement environment |
| title_fullStr | Improving production testing of RF products in a noisy measurement environment |
| title_full_unstemmed | Improving production testing of RF products in a noisy measurement environment |
| title_short | Improving production testing of RF products in a noisy measurement environment |
| title_sort | improving production testing of rf products in a noisy measurement environment |
| topic | Sloan School of Management Electrical Engineering and Computer Science |
| url | http://hdl.handle.net/1721.1/10942 |
| work_keys_str_mv | AT myersmparkermarionparker improvingproductiontestingofrfproductsinanoisymeasurementenvironment |