A high-throughput technique for determining grain boundary character non-destructively in microstructures with through-thickness grains
Grain boundaries (GBs) govern many properties of polycrystalline materials. However, because of their structural variability, our knowledge of GB constitutive relations is still very limited. We present a novel method to characterise the complete crystallography of individual GBs non-destructively,...
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Springer Nature
2017
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Online Access: | http://hdl.handle.net/1721.1/109795 https://orcid.org/0000-0001-9856-2682 https://orcid.org/0000-0003-3949-0441 |
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author | Seita, Matteo Volpi, Marco Patala, Srikanth McCue, Ian Schuh, Christopher A Diamanti, Maria Vittoria Erlebacher, Jonah Demkowicz, Michael J |
author2 | Massachusetts Institute of Technology. Department of Materials Science and Engineering |
author_facet | Massachusetts Institute of Technology. Department of Materials Science and Engineering Seita, Matteo Volpi, Marco Patala, Srikanth McCue, Ian Schuh, Christopher A Diamanti, Maria Vittoria Erlebacher, Jonah Demkowicz, Michael J |
author_sort | Seita, Matteo |
collection | MIT |
description | Grain boundaries (GBs) govern many properties of polycrystalline materials. However, because of their structural variability, our knowledge of GB constitutive relations is still very limited. We present a novel method to characterise the complete crystallography of individual GBs non-destructively, with high-throughput, and using commercially available tools. This method combines electron diffraction, optical reflectance and numerical image analysis to determine all five crystallographic parameters of numerous GBs in samples with through-thickness grains. We demonstrate the technique by measuring the crystallographic character of about 1,000 individual GBs in aluminum in a single run. Our method enables cost- and time-effective assembly of crystallography–property databases for thousands of individual GBs. Such databases are essential for identifying GB constitutive relations and for predicting GB-related behaviours of polycrystalline solids. |
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format | Article |
id | mit-1721.1/109795 |
institution | Massachusetts Institute of Technology |
language | en_US |
last_indexed | 2024-09-23T08:46:06Z |
publishDate | 2017 |
publisher | Springer Nature |
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spelling | mit-1721.1/1097952022-09-23T14:24:59Z A high-throughput technique for determining grain boundary character non-destructively in microstructures with through-thickness grains Seita, Matteo Volpi, Marco Patala, Srikanth McCue, Ian Schuh, Christopher A Diamanti, Maria Vittoria Erlebacher, Jonah Demkowicz, Michael J Massachusetts Institute of Technology. Department of Materials Science and Engineering Massachusetts Institute of Technology. Department of Mechanical Engineering Seita, Matteo Volpi, Marco Patala, Srikanth Schuh, Christopher A Diamanti, Maria Vittoria Demkowicz, Michael J Grain boundaries (GBs) govern many properties of polycrystalline materials. However, because of their structural variability, our knowledge of GB constitutive relations is still very limited. We present a novel method to characterise the complete crystallography of individual GBs non-destructively, with high-throughput, and using commercially available tools. This method combines electron diffraction, optical reflectance and numerical image analysis to determine all five crystallographic parameters of numerous GBs in samples with through-thickness grains. We demonstrate the technique by measuring the crystallographic character of about 1,000 individual GBs in aluminum in a single run. Our method enables cost- and time-effective assembly of crystallography–property databases for thousands of individual GBs. Such databases are essential for identifying GB constitutive relations and for predicting GB-related behaviours of polycrystalline solids. United States. Department of Energy. Office of Basic Energy Sciences (award no DE-SC0008926) MIT International Science and Technology Initiatives National Science Foundation (U.S.) (grant DMR-1003901) 2017-06-12T17:42:25Z 2017-06-12T17:42:25Z 2016-06 2016-05 Article http://purl.org/eprint/type/JournalArticle 2057-3960 http://hdl.handle.net/1721.1/109795 Seita, Matteo, Marco Volpi, Srikanth Patala, Ian McCue, Christopher A Schuh, Maria Vittoria Diamanti, Jonah Erlebacher, and Michael J Demkowicz. “A High-Throughput Technique for Determining Grain Boundary Character Non-Destructively in Microstructures with through-Thickness Grains.” Npj Computational Materials 2 (June 24, 2016): 16016. https://orcid.org/0000-0001-9856-2682 https://orcid.org/0000-0003-3949-0441 en_US http://dx.doi.org/10.1038/npjcompumats.2016.16 npj Computational Materials Creative Commons Attribution 4.0 International License http://creativecommons.org/licenses/by/4.0/ application/pdf Springer Nature Nature |
spellingShingle | Seita, Matteo Volpi, Marco Patala, Srikanth McCue, Ian Schuh, Christopher A Diamanti, Maria Vittoria Erlebacher, Jonah Demkowicz, Michael J A high-throughput technique for determining grain boundary character non-destructively in microstructures with through-thickness grains |
title | A high-throughput technique for determining grain boundary character non-destructively in microstructures with through-thickness grains |
title_full | A high-throughput technique for determining grain boundary character non-destructively in microstructures with through-thickness grains |
title_fullStr | A high-throughput technique for determining grain boundary character non-destructively in microstructures with through-thickness grains |
title_full_unstemmed | A high-throughput technique for determining grain boundary character non-destructively in microstructures with through-thickness grains |
title_short | A high-throughput technique for determining grain boundary character non-destructively in microstructures with through-thickness grains |
title_sort | high throughput technique for determining grain boundary character non destructively in microstructures with through thickness grains |
url | http://hdl.handle.net/1721.1/109795 https://orcid.org/0000-0001-9856-2682 https://orcid.org/0000-0003-3949-0441 |
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