Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation

The brightness of nanoscale optical materials such as semiconductor nanocrystals is currently limited in high excitation flux applications by inefficient multiexciton fluorescence. We have devised a solution-phase photon correlation measurement that can conveniently and reliably measure the average...

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Main Authors: Beyler, Andrew P., Bischof, Thomas Stanley, Cui, Jian, Coropceanu, Igor, Harris, Daniel Kelly, Bawendi, Moungi G
מחברים אחרים: Massachusetts Institute of Technology. Department of Chemistry
פורמט: Article
שפה:en_US
יצא לאור: American Chemical Society (ACS) 2017
גישה מקוונת:http://hdl.handle.net/1721.1/110437
https://orcid.org/0000-0002-5613-8928
https://orcid.org/0000-0003-2112-7388
https://orcid.org/0000-0001-8057-1134
https://orcid.org/0000-0003-2220-4365
_version_ 1826216422133465088
author Beyler, Andrew P.
Bischof, Thomas Stanley
Cui, Jian
Coropceanu, Igor
Harris, Daniel Kelly
Bawendi, Moungi G
author2 Massachusetts Institute of Technology. Department of Chemistry
author_facet Massachusetts Institute of Technology. Department of Chemistry
Beyler, Andrew P.
Bischof, Thomas Stanley
Cui, Jian
Coropceanu, Igor
Harris, Daniel Kelly
Bawendi, Moungi G
author_sort Beyler, Andrew P.
collection MIT
description The brightness of nanoscale optical materials such as semiconductor nanocrystals is currently limited in high excitation flux applications by inefficient multiexciton fluorescence. We have devised a solution-phase photon correlation measurement that can conveniently and reliably measure the average biexciton-to-exciton quantum yield ratio of an entire sample without user selection bias. This technique can be used to investigate the multiexciton recombination dynamics of a broad scope of synthetically underdeveloped materials, including those with low exciton quantum yields and poor fluorescence stability. Here, we have applied this method to measure weak biexciton fluorescence in samples of visible-emitting InP/ZnS and InAs/ZnS core/shell nanocrystals, and to demonstrate that a rapid CdS shell growth procedure can markedly increase the biexciton fluorescence of CdSe nanocrystals.
first_indexed 2024-09-23T16:47:25Z
format Article
id mit-1721.1/110437
institution Massachusetts Institute of Technology
language en_US
last_indexed 2024-09-23T16:47:25Z
publishDate 2017
publisher American Chemical Society (ACS)
record_format dspace
spelling mit-1721.1/1104372022-10-03T08:19:21Z Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation Beyler, Andrew P. Bischof, Thomas Stanley Cui, Jian Coropceanu, Igor Harris, Daniel Kelly Bawendi, Moungi G Massachusetts Institute of Technology. Department of Chemistry Beyler, Andrew P. Bischof, Thomas Stanley Cui, Jian Coropceanu, Igor Harris, Daniel Kelly Bawendi, Moungi G The brightness of nanoscale optical materials such as semiconductor nanocrystals is currently limited in high excitation flux applications by inefficient multiexciton fluorescence. We have devised a solution-phase photon correlation measurement that can conveniently and reliably measure the average biexciton-to-exciton quantum yield ratio of an entire sample without user selection bias. This technique can be used to investigate the multiexciton recombination dynamics of a broad scope of synthetically underdeveloped materials, including those with low exciton quantum yields and poor fluorescence stability. Here, we have applied this method to measure weak biexciton fluorescence in samples of visible-emitting InP/ZnS and InAs/ZnS core/shell nanocrystals, and to demonstrate that a rapid CdS shell growth procedure can markedly increase the biexciton fluorescence of CdSe nanocrystals. United States. Dept. of Energy. Office of Basic Energy Sciences (DE-FG02-07ER46454) United States. Dept. of Energy. Office of Basic Energy Sciences (DE-SC0001088) National Institutes of Health (U.S.) (9P41EB015871-26A1) 2017-07-05T13:26:12Z 2017-07-05T13:26:12Z 2014-11 2014-07 Article http://purl.org/eprint/type/JournalArticle 1530-6984 1530-6992 http://hdl.handle.net/1721.1/110437 Beyler, Andrew P.; Bischof, Thomas S.; Cui, Jian; Coropceanu, Igor; Harris, Daniel K. and Bawendi, Moungi G. “Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation.” Nano Letters 14, 12 (December 2014): 6792–6798 © 2014 American Chemical Society https://orcid.org/0000-0002-5613-8928 https://orcid.org/0000-0003-2112-7388 https://orcid.org/0000-0001-8057-1134 https://orcid.org/0000-0003-2220-4365 en_US http://dx.doi.org/10.1021/nl5027953 Nano Letters Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Chemical Society (ACS) PMC
spellingShingle Beyler, Andrew P.
Bischof, Thomas Stanley
Cui, Jian
Coropceanu, Igor
Harris, Daniel Kelly
Bawendi, Moungi G
Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation
title Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation
title_full Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation
title_fullStr Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation
title_full_unstemmed Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation
title_short Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation
title_sort sample averaged biexciton quantum yield measured by solution phase photon correlation
url http://hdl.handle.net/1721.1/110437
https://orcid.org/0000-0002-5613-8928
https://orcid.org/0000-0003-2112-7388
https://orcid.org/0000-0001-8057-1134
https://orcid.org/0000-0003-2220-4365
work_keys_str_mv AT beylerandrewp sampleaveragedbiexcitonquantumyieldmeasuredbysolutionphasephotoncorrelation
AT bischofthomasstanley sampleaveragedbiexcitonquantumyieldmeasuredbysolutionphasephotoncorrelation
AT cuijian sampleaveragedbiexcitonquantumyieldmeasuredbysolutionphasephotoncorrelation
AT coropceanuigor sampleaveragedbiexcitonquantumyieldmeasuredbysolutionphasephotoncorrelation
AT harrisdanielkelly sampleaveragedbiexcitonquantumyieldmeasuredbysolutionphasephotoncorrelation
AT bawendimoungig sampleaveragedbiexcitonquantumyieldmeasuredbysolutionphasephotoncorrelation