Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation
The brightness of nanoscale optical materials such as semiconductor nanocrystals is currently limited in high excitation flux applications by inefficient multiexciton fluorescence. We have devised a solution-phase photon correlation measurement that can conveniently and reliably measure the average...
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פורמט: | Article |
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American Chemical Society (ACS)
2017
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גישה מקוונת: | http://hdl.handle.net/1721.1/110437 https://orcid.org/0000-0002-5613-8928 https://orcid.org/0000-0003-2112-7388 https://orcid.org/0000-0001-8057-1134 https://orcid.org/0000-0003-2220-4365 |
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author | Beyler, Andrew P. Bischof, Thomas Stanley Cui, Jian Coropceanu, Igor Harris, Daniel Kelly Bawendi, Moungi G |
author2 | Massachusetts Institute of Technology. Department of Chemistry |
author_facet | Massachusetts Institute of Technology. Department of Chemistry Beyler, Andrew P. Bischof, Thomas Stanley Cui, Jian Coropceanu, Igor Harris, Daniel Kelly Bawendi, Moungi G |
author_sort | Beyler, Andrew P. |
collection | MIT |
description | The brightness of nanoscale optical materials such as semiconductor nanocrystals is currently limited in high excitation flux applications by inefficient multiexciton fluorescence. We have devised a solution-phase photon correlation measurement that can conveniently and reliably measure the average biexciton-to-exciton quantum yield ratio of an entire sample without user selection bias. This technique can be used to investigate the multiexciton recombination dynamics of a broad scope of synthetically underdeveloped materials, including those with low exciton quantum yields and poor fluorescence stability. Here, we have applied this method to measure weak biexciton fluorescence in samples of visible-emitting InP/ZnS and InAs/ZnS core/shell nanocrystals, and to demonstrate that a rapid CdS shell growth procedure can markedly increase the biexciton fluorescence of CdSe nanocrystals. |
first_indexed | 2024-09-23T16:47:25Z |
format | Article |
id | mit-1721.1/110437 |
institution | Massachusetts Institute of Technology |
language | en_US |
last_indexed | 2024-09-23T16:47:25Z |
publishDate | 2017 |
publisher | American Chemical Society (ACS) |
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spelling | mit-1721.1/1104372022-10-03T08:19:21Z Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation Beyler, Andrew P. Bischof, Thomas Stanley Cui, Jian Coropceanu, Igor Harris, Daniel Kelly Bawendi, Moungi G Massachusetts Institute of Technology. Department of Chemistry Beyler, Andrew P. Bischof, Thomas Stanley Cui, Jian Coropceanu, Igor Harris, Daniel Kelly Bawendi, Moungi G The brightness of nanoscale optical materials such as semiconductor nanocrystals is currently limited in high excitation flux applications by inefficient multiexciton fluorescence. We have devised a solution-phase photon correlation measurement that can conveniently and reliably measure the average biexciton-to-exciton quantum yield ratio of an entire sample without user selection bias. This technique can be used to investigate the multiexciton recombination dynamics of a broad scope of synthetically underdeveloped materials, including those with low exciton quantum yields and poor fluorescence stability. Here, we have applied this method to measure weak biexciton fluorescence in samples of visible-emitting InP/ZnS and InAs/ZnS core/shell nanocrystals, and to demonstrate that a rapid CdS shell growth procedure can markedly increase the biexciton fluorescence of CdSe nanocrystals. United States. Dept. of Energy. Office of Basic Energy Sciences (DE-FG02-07ER46454) United States. Dept. of Energy. Office of Basic Energy Sciences (DE-SC0001088) National Institutes of Health (U.S.) (9P41EB015871-26A1) 2017-07-05T13:26:12Z 2017-07-05T13:26:12Z 2014-11 2014-07 Article http://purl.org/eprint/type/JournalArticle 1530-6984 1530-6992 http://hdl.handle.net/1721.1/110437 Beyler, Andrew P.; Bischof, Thomas S.; Cui, Jian; Coropceanu, Igor; Harris, Daniel K. and Bawendi, Moungi G. “Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation.” Nano Letters 14, 12 (December 2014): 6792–6798 © 2014 American Chemical Society https://orcid.org/0000-0002-5613-8928 https://orcid.org/0000-0003-2112-7388 https://orcid.org/0000-0001-8057-1134 https://orcid.org/0000-0003-2220-4365 en_US http://dx.doi.org/10.1021/nl5027953 Nano Letters Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Chemical Society (ACS) PMC |
spellingShingle | Beyler, Andrew P. Bischof, Thomas Stanley Cui, Jian Coropceanu, Igor Harris, Daniel Kelly Bawendi, Moungi G Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation |
title | Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation |
title_full | Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation |
title_fullStr | Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation |
title_full_unstemmed | Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation |
title_short | Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation |
title_sort | sample averaged biexciton quantum yield measured by solution phase photon correlation |
url | http://hdl.handle.net/1721.1/110437 https://orcid.org/0000-0002-5613-8928 https://orcid.org/0000-0003-2112-7388 https://orcid.org/0000-0001-8057-1134 https://orcid.org/0000-0003-2220-4365 |
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