Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation

Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation

The brightness of nanoscale optical materials such as semiconductor nanocrystals is currently limited in high excitation flux applications by inefficient multiexciton fluorescence. We have devised a solution-phase photon correlation measurement that can conveniently and reliably measure the average...

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Bibliographic Details
Main Authors: Beyler, Andrew P., Bischof, Thomas Stanley, Cui, Jian, Coropceanu, Igor, Harris, Daniel Kelly, Bawendi, Moungi G
Other Authors: Massachusetts Institute of Technology. Department of Chemistry
Format: Article
Language:en_US
Published: American Chemical Society (ACS) 2017
Online Access:http://hdl.handle.net/1721.1/110437
https://orcid.org/0000-0002-5613-8928
https://orcid.org/0000-0003-2112-7388
https://orcid.org/0000-0001-8057-1134
https://orcid.org/0000-0003-2220-4365

Internet

http://hdl.handle.net/1721.1/110437
https://orcid.org/0000-0002-5613-8928
https://orcid.org/0000-0003-2112-7388
https://orcid.org/0000-0001-8057-1134
https://orcid.org/0000-0003-2220-4365

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