Microgrid risk reduction for design and validation testing using controller hardware in the loop

Microgrid risk reduction for design and validation testing using controller hardware in the loop

Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2017.

Bibliographic Details
Main Author: Nowocin, John Kendall
Other Authors: James L. Kirtley.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2017
Subjects:
Electrical Engineering and Computer Science.
Online Access:http://hdl.handle.net/1721.1/111906

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