Evidence for ferromagnetic coupling at the doped topological insulator/ferrimagnetic insulator interface

One of the major obstacles of the magnetic topological insulators (TIs) impeding their practical use is the low Curie temperature (T[subscript c] ). Very recently, we have demonstrated the enhancement of the magnetic ordering in Cr-doped Bi₂Se₃ by means of proximity to the high-T[subscript c] ferri...

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Main Authors: Liu, Wenqing, He, Liang, Zhou, Yan, Murata, Koichi, Jiang, Ying, Wang, Yong, Xu, Yongbing, Zhang, Rong, Wang, Kang. L., Onbasli, Mehmet C., Ross, Caroline A
Other Authors: Massachusetts Institute of Technology. Department of Materials Science and Engineering
Format: Article
Published: American Institute of Physics (AIP) 2017
Online Access:http://hdl.handle.net/1721.1/111957
https://orcid.org/0000-0003-2262-1249
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author Liu, Wenqing
He, Liang
Zhou, Yan
Murata, Koichi
Jiang, Ying
Wang, Yong
Xu, Yongbing
Zhang, Rong
Wang, Kang. L.
Onbasli, Mehmet C.
Ross, Caroline A
author2 Massachusetts Institute of Technology. Department of Materials Science and Engineering
author_facet Massachusetts Institute of Technology. Department of Materials Science and Engineering
Liu, Wenqing
He, Liang
Zhou, Yan
Murata, Koichi
Jiang, Ying
Wang, Yong
Xu, Yongbing
Zhang, Rong
Wang, Kang. L.
Onbasli, Mehmet C.
Ross, Caroline A
author_sort Liu, Wenqing
collection MIT
description One of the major obstacles of the magnetic topological insulators (TIs) impeding their practical use is the low Curie temperature (T[subscript c] ). Very recently, we have demonstrated the enhancement of the magnetic ordering in Cr-doped Bi₂Se₃ by means of proximity to the high-T[subscript c] ferrimagnetic insulator (FMI) Y₃Fe₅O₁₂ and found a large and rapidly decreasing penetration depth of the proximity effect, suggestive of a different carrier propagation process near the TI surface. Here we further present a study of the interfacial magnetic interaction of this TI/FMI heterostrucutre. The synchrotron-based X-ray magnetic circular dichroism (XMCD) technique was used to probe the nature of the exchange coupling of the Bi[subscript 2-x] Cr [subscript x] Se₃/Y₃Fe₅O₁₂ interface. We found that the Bi[subscript 2-x] Cr [subscript x] Se₃ grown on Y₃Fe₅O₁₂ (111) predominately contains Cr ³⁺ cations, and the spin direction of the Cr³⁺ is aligned parallel to that of tetrahedral Fe³⁺ of the YIG, revealing a ferromagnetic exchange coupling between the Bi [subscript 2-x] Cr [subscript x] Se₃ and the Y₃Fe₅O₁₂.
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spelling mit-1721.1/1119572022-09-30T18:01:30Z Evidence for ferromagnetic coupling at the doped topological insulator/ferrimagnetic insulator interface Liu, Wenqing He, Liang Zhou, Yan Murata, Koichi Jiang, Ying Wang, Yong Xu, Yongbing Zhang, Rong Wang, Kang. L. Onbasli, Mehmet C. Ross, Caroline A Massachusetts Institute of Technology. Department of Materials Science and Engineering Onbasli, Mehmet C. Ross, Caroline A One of the major obstacles of the magnetic topological insulators (TIs) impeding their practical use is the low Curie temperature (T[subscript c] ). Very recently, we have demonstrated the enhancement of the magnetic ordering in Cr-doped Bi₂Se₃ by means of proximity to the high-T[subscript c] ferrimagnetic insulator (FMI) Y₃Fe₅O₁₂ and found a large and rapidly decreasing penetration depth of the proximity effect, suggestive of a different carrier propagation process near the TI surface. Here we further present a study of the interfacial magnetic interaction of this TI/FMI heterostrucutre. The synchrotron-based X-ray magnetic circular dichroism (XMCD) technique was used to probe the nature of the exchange coupling of the Bi[subscript 2-x] Cr [subscript x] Se₃/Y₃Fe₅O₁₂ interface. We found that the Bi[subscript 2-x] Cr [subscript x] Se₃ grown on Y₃Fe₅O₁₂ (111) predominately contains Cr ³⁺ cations, and the spin direction of the Cr³⁺ is aligned parallel to that of tetrahedral Fe³⁺ of the YIG, revealing a ferromagnetic exchange coupling between the Bi [subscript 2-x] Cr [subscript x] Se₃ and the Y₃Fe₅O₁₂. United States. Defense Advanced Research Projects Agency (N66001-12-1-4034) United States. Defense Advanced Research Projects Agency (N66001-11-1-4105) 2017-10-23T16:22:25Z 2017-10-23T16:22:25Z 2016-03 2016-01 2017-10-17T15:57:06Z Article http://purl.org/eprint/type/JournalArticle 2158-3226 http://hdl.handle.net/1721.1/111957 Liu, Wenqing et al. “Evidence for Ferromagnetic Coupling at the Doped Topological Insulator/ferrimagnetic Insulator Interface.” AIP Advances 6, 5 (May 2016): 055813 © 2016 Author(s) https://orcid.org/0000-0003-2262-1249 http://dx.doi.org/10.1063/1.4943157 AIP Advances Creative Commons Attribution 4.0 International License http://creativecommons.org/licenses/by/4.0/ application/pdf American Institute of Physics (AIP) American Institute of Physics (AIP)
spellingShingle Liu, Wenqing
He, Liang
Zhou, Yan
Murata, Koichi
Jiang, Ying
Wang, Yong
Xu, Yongbing
Zhang, Rong
Wang, Kang. L.
Onbasli, Mehmet C.
Ross, Caroline A
Evidence for ferromagnetic coupling at the doped topological insulator/ferrimagnetic insulator interface
title Evidence for ferromagnetic coupling at the doped topological insulator/ferrimagnetic insulator interface
title_full Evidence for ferromagnetic coupling at the doped topological insulator/ferrimagnetic insulator interface
title_fullStr Evidence for ferromagnetic coupling at the doped topological insulator/ferrimagnetic insulator interface
title_full_unstemmed Evidence for ferromagnetic coupling at the doped topological insulator/ferrimagnetic insulator interface
title_short Evidence for ferromagnetic coupling at the doped topological insulator/ferrimagnetic insulator interface
title_sort evidence for ferromagnetic coupling at the doped topological insulator ferrimagnetic insulator interface
url http://hdl.handle.net/1721.1/111957
https://orcid.org/0000-0003-2262-1249
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