Design and Modeling of Membrane-Based Evaporative Cooling Devices for Thermal Management of High Heat Fluxes

We present a high-heat-flux cooling device for advanced thermal management of electronics. The device incorporates nanoporous membranes supported on microchannels to enable thin-film evaporation. The underlying concept takes advantage of the capillary pressure generated by small pores in the membran...

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Bibliographic Details
Main Authors: Salamon, Todd R., Narayanan, Shankar, Simon, Maria E., Lu, Zhengmao, Bagnall, Kevin R., Hanks, Daniel Frank, Antao, Dion Savio, Barabadi, Banafsheh, Sircar, Jay, Wang, Evelyn
Other Authors: Lincoln Laboratory
Format: Article
Language:en_US
Published: Institute of Electrical and Electronics Engineers (IEEE) 2017
Online Access:http://hdl.handle.net/1721.1/112125
https://orcid.org/0000-0002-5938-717X
https://orcid.org/0000-0002-5042-4819
https://orcid.org/0000-0002-8974-756X
https://orcid.org/0000-0003-4165-4732
https://orcid.org/0000-0003-0550-1739
https://orcid.org/0000-0001-8643-9281
https://orcid.org/0000-0001-7045-1200
Description
Summary:We present a high-heat-flux cooling device for advanced thermal management of electronics. The device incorporates nanoporous membranes supported on microchannels to enable thin-film evaporation. The underlying concept takes advantage of the capillary pressure generated by small pores in the membrane, and minimizes the viscous loss by reducing the membrane thickness. The heat transfer and fluid flow in the device were modeled to determine the effect of different geometric parameters. With the optimization of various parameters, the device can achieve a heat transfer coefficient in excess of 0.05 kW/cm²-K, while dissipating a heat flux of 1 kW/cm². When applied to power electronics, such as GaN high-electron-mobility transistors, this membrane-based evaporative cooling device can lower the near-junction temperature by more than 40 K compared with contemporary single-phase microchannel coolers.