A nanofabricated, monolithic, path-separated electron interferometer
Progress in nanofabrication technology has enabled the development of numerous electron optic elements for enhancing image contrast and manipulating electron wave functions. Here, we describe a modular, self-aligned, amplitude-division electron interferometer in a conventional transmission electron...
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Nature Publishing Group
2017
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| Online Access: | http://hdl.handle.net/1721.1/112709 https://orcid.org/0000-0002-5944-3346 https://orcid.org/0000-0002-8547-0639 https://orcid.org/0000-0003-0855-3710 https://orcid.org/0000-0001-7453-9031 |
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| author | Dyck, Dirk van Agarwal, Akshay Kim, Chungsoo Hobbs, Richard Berggren, Karl K |
| author2 | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science |
| author_facet | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Dyck, Dirk van Agarwal, Akshay Kim, Chungsoo Hobbs, Richard Berggren, Karl K |
| author_sort | Dyck, Dirk van |
| collection | MIT |
| description | Progress in nanofabrication technology has enabled the development of numerous electron optic elements for enhancing image contrast and manipulating electron wave functions. Here, we describe a modular, self-aligned, amplitude-division electron interferometer in a conventional transmission electron microscope. The interferometer consists of two 45-nm-thick silicon layers separated by 20 μm. This interferometer is fabricated from a single-crystal silicon cantilever on a transmission electron microscope grid by gallium focused-ion-beam milling. Using this interferometer, we obtain interference fringes in a Mach-Zehnder geometry in an unmodified 200 kV transmission electron microscope. The fringes have a period of 0.32 nm, which corresponds to the [111] lattice planes of silicon, and a maximum contrast of 15%. We use convergent-beam electron diffraction to quantify grating alignment and coherence. This design can potentially be scaled to millimeter-scale, and used in electron holography. It could also be applied to perform fundamental physics experiments, such as interaction-free measurement with electrons. |
| first_indexed | 2024-09-23T11:47:10Z |
| format | Article |
| id | mit-1721.1/112709 |
| institution | Massachusetts Institute of Technology |
| last_indexed | 2024-09-23T11:47:10Z |
| publishDate | 2017 |
| publisher | Nature Publishing Group |
| record_format | dspace |
| spelling | mit-1721.1/1127092022-10-01T06:02:56Z A nanofabricated, monolithic, path-separated electron interferometer Dyck, Dirk van Agarwal, Akshay Kim, Chungsoo Hobbs, Richard Berggren, Karl K Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Agarwal, Akshay Kim, Chungsoo Hobbs, Richard Berggren, Karl K Progress in nanofabrication technology has enabled the development of numerous electron optic elements for enhancing image contrast and manipulating electron wave functions. Here, we describe a modular, self-aligned, amplitude-division electron interferometer in a conventional transmission electron microscope. The interferometer consists of two 45-nm-thick silicon layers separated by 20 μm. This interferometer is fabricated from a single-crystal silicon cantilever on a transmission electron microscope grid by gallium focused-ion-beam milling. Using this interferometer, we obtain interference fringes in a Mach-Zehnder geometry in an unmodified 200 kV transmission electron microscope. The fringes have a period of 0.32 nm, which corresponds to the [111] lattice planes of silicon, and a maximum contrast of 15%. We use convergent-beam electron diffraction to quantify grating alignment and coherence. This design can potentially be scaled to millimeter-scale, and used in electron holography. It could also be applied to perform fundamental physics experiments, such as interaction-free measurement with electrons. 2017-12-12T15:48:45Z 2017-12-12T15:48:45Z 2017-05 2016-12 2017-12-11T17:11:57Z Article http://purl.org/eprint/type/JournalArticle 2045-2322 http://hdl.handle.net/1721.1/112709 Agarwal, Akshay et al. "A nanofabricated, monolithic, path-separated electron interferometer." Scientific Reports 7, 1 (May 2017): 1677 © 2017 The Author(s) https://orcid.org/0000-0002-5944-3346 https://orcid.org/0000-0002-8547-0639 https://orcid.org/0000-0003-0855-3710 https://orcid.org/0000-0001-7453-9031 http://dx.doi.org/10.1038/s41598-017-01466-0 Scientific Reports Creative Commons Attribution 4.0 International https://creativecommons.org/licenses/by/4.0/ application/pdf Nature Publishing Group Nature |
| spellingShingle | Dyck, Dirk van Agarwal, Akshay Kim, Chungsoo Hobbs, Richard Berggren, Karl K A nanofabricated, monolithic, path-separated electron interferometer |
| title | A nanofabricated, monolithic, path-separated electron interferometer |
| title_full | A nanofabricated, monolithic, path-separated electron interferometer |
| title_fullStr | A nanofabricated, monolithic, path-separated electron interferometer |
| title_full_unstemmed | A nanofabricated, monolithic, path-separated electron interferometer |
| title_short | A nanofabricated, monolithic, path-separated electron interferometer |
| title_sort | nanofabricated monolithic path separated electron interferometer |
| url | http://hdl.handle.net/1721.1/112709 https://orcid.org/0000-0002-5944-3346 https://orcid.org/0000-0002-8547-0639 https://orcid.org/0000-0003-0855-3710 https://orcid.org/0000-0001-7453-9031 |
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