Deep Metric Learning via Lifted Structured Feature Embedding
Learning the distance metric between pairs of examples is of great importance for learning and visual recognition. With the remarkable success from the state of the art convolutional neural networks, recent works [1, 31] have shown promising results on discriminatively training the networks to learn...
| Main Authors: | , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | en_US |
| Published: |
Institute of Electrical and Electronics Engineers (IEEE)
2018
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| Online Access: | http://hdl.handle.net/1721.1/113397 https://orcid.org/0000-0002-6121-9474 |