Modeling of electron transport in sub-100 nm channel length silicon MOSFETs

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.

Bibliographic Details
Main Author: Jacobs, Jarvis Benjamin
Other Authors: Dimitri Antoniadis
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2005
Subjects:
Online Access:http://hdl.handle.net/1721.1/11414
_version_ 1811094487431118848
author Jacobs, Jarvis Benjamin
author2 Dimitri Antoniadis
author_facet Dimitri Antoniadis
Jacobs, Jarvis Benjamin
author_sort Jacobs, Jarvis Benjamin
collection MIT
description Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.
first_indexed 2024-09-23T16:01:05Z
format Thesis
id mit-1721.1/11414
institution Massachusetts Institute of Technology
language eng
last_indexed 2024-09-23T16:01:05Z
publishDate 2005
publisher Massachusetts Institute of Technology
record_format dspace
spelling mit-1721.1/114142019-04-10T17:38:14Z Modeling of electron transport in sub-100 nm channel length silicon MOSFETs Jacobs, Jarvis Benjamin Dimitri Antoniadis Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science Electrical Engineering and Computer Science Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995. Includes bibliographical references (p. 216). by Jarvis B. Jacobs. Ph.D. 2005-08-17T18:20:10Z 2005-08-17T18:20:10Z 1995 1995 Thesis http://hdl.handle.net/1721.1/11414 33227898 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 216 p. 11272228 bytes 11271983 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology
spellingShingle Electrical Engineering and Computer Science
Jacobs, Jarvis Benjamin
Modeling of electron transport in sub-100 nm channel length silicon MOSFETs
title Modeling of electron transport in sub-100 nm channel length silicon MOSFETs
title_full Modeling of electron transport in sub-100 nm channel length silicon MOSFETs
title_fullStr Modeling of electron transport in sub-100 nm channel length silicon MOSFETs
title_full_unstemmed Modeling of electron transport in sub-100 nm channel length silicon MOSFETs
title_short Modeling of electron transport in sub-100 nm channel length silicon MOSFETs
title_sort modeling of electron transport in sub 100 nm channel length silicon mosfets
topic Electrical Engineering and Computer Science
url http://hdl.handle.net/1721.1/11414
work_keys_str_mv AT jacobsjarvisbenjamin modelingofelectrontransportinsub100nmchannellengthsiliconmosfets