Photoreceptor Layer Thickness Changes During Dark Adaptation Observed With Ultrahigh-Resolution Optical Coherence Tomography
PURPOSE. To examine outer retinal band changes after flash stimulus and subsequent dark adaptation with ultrahigh-resolution optical coherence tomography (UHR-OCT). METHODS. Five dark-adapted left eyes of five normal subjects were imaged with 3-μm axialresolution UHR-OCT during 30 minutes of dark ad...
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Association for Research in Vision and Ophthalmology (ARVO)
2018
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| Online Access: | http://hdl.handle.net/1721.1/114249 https://orcid.org/0000-0001-6235-0143 https://orcid.org/0000-0001-5262-2264 https://orcid.org/0000-0002-0828-4357 |
| _version_ | 1811094169497632768 |
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| author | Schottenhamml, Julia Maier, Andreas Pugh, Edward N. Lu, Chen David Lee, ByungKun Fujimoto, James G |
| author2 | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science |
| author_facet | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Schottenhamml, Julia Maier, Andreas Pugh, Edward N. Lu, Chen David Lee, ByungKun Fujimoto, James G |
| author_sort | Schottenhamml, Julia |
| collection | MIT |
| description | PURPOSE. To examine outer retinal band changes after flash stimulus and subsequent dark adaptation with ultrahigh-resolution optical coherence tomography (UHR-OCT). METHODS. Five dark-adapted left eyes of five normal subjects were imaged with 3-μm axialresolution UHR-OCT during 30 minutes of dark adaptation following 96%, 54%, 23%, and 0% full-field and 54% half-field rhodopsin bleach. We identified the ellipsoid zone inner segment/outer segment (EZ[IS/OS]), cone interdigitation zone (CIZ), rod interdigitation zone (RIZ), retinal pigment epithelium (RPE), and Bruch’s membrane (BM) axial positions and generated two-dimensional thickness maps of the EZ(IS/OS) to the four bands. The average thickness over an area of the thickness map was compared against that of the dark-adapted baselines. The time-dependent thickness changes (photoresponses) were statistically compared against 0% bleach. Dark adaptometry was performed with the same bleaching protocol. RESULTS. The EZ(IS/OS)-CIZ photoresponse was significantly different at 96% (P < 0.0001) and 54% (P = 0.006) bleach. At all three bleaching levels, the EZ(IS/OS)-RIZ, -RPE, and -BM responses were significantly different (P < 0.0001). The EZ(IS/OS)-CIZ and EZ(IS/OS)-RIZ time courses were similar to the recovery of rod- and cone-mediated sensitivity, respectively, measured with dark adaptometry. The maximal EZ(IS/OS)-CIZ and EZ(IS/OS)-RIZ response magnitudes doubled from 54% to 96% bleach. Both EZ(IS/OS)-RPE and EZ(IS/OS)-BM responses resembled dampened oscillations that were graded in amplitude and duration with bleaching intensity. Half-field photoresponses were localized to the stimulated retina. CONCLUSIONS. With noninvasive, near-infrared UHR-OCT, we characterized three distinct, spatially localized photoresponses in the outer retinal bands. These photoresponses have potential value as physical correlates of photoreceptor function. |
| first_indexed | 2024-09-23T15:56:00Z |
| format | Article |
| id | mit-1721.1/114249 |
| institution | Massachusetts Institute of Technology |
| last_indexed | 2024-09-23T15:56:00Z |
| publishDate | 2018 |
| publisher | Association for Research in Vision and Ophthalmology (ARVO) |
| record_format | dspace |
| spelling | mit-1721.1/1142492022-09-29T17:08:39Z Photoreceptor Layer Thickness Changes During Dark Adaptation Observed With Ultrahigh-Resolution Optical Coherence Tomography Schottenhamml, Julia Maier, Andreas Pugh, Edward N. Lu, Chen David Lee, ByungKun Fujimoto, James G Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology. Research Laboratory of Electronics Lu, Chen David Lee, ByungKun Fujimoto, James G PURPOSE. To examine outer retinal band changes after flash stimulus and subsequent dark adaptation with ultrahigh-resolution optical coherence tomography (UHR-OCT). METHODS. Five dark-adapted left eyes of five normal subjects were imaged with 3-μm axialresolution UHR-OCT during 30 minutes of dark adaptation following 96%, 54%, 23%, and 0% full-field and 54% half-field rhodopsin bleach. We identified the ellipsoid zone inner segment/outer segment (EZ[IS/OS]), cone interdigitation zone (CIZ), rod interdigitation zone (RIZ), retinal pigment epithelium (RPE), and Bruch’s membrane (BM) axial positions and generated two-dimensional thickness maps of the EZ(IS/OS) to the four bands. The average thickness over an area of the thickness map was compared against that of the dark-adapted baselines. The time-dependent thickness changes (photoresponses) were statistically compared against 0% bleach. Dark adaptometry was performed with the same bleaching protocol. RESULTS. The EZ(IS/OS)-CIZ photoresponse was significantly different at 96% (P < 0.0001) and 54% (P = 0.006) bleach. At all three bleaching levels, the EZ(IS/OS)-RIZ, -RPE, and -BM responses were significantly different (P < 0.0001). The EZ(IS/OS)-CIZ and EZ(IS/OS)-RIZ time courses were similar to the recovery of rod- and cone-mediated sensitivity, respectively, measured with dark adaptometry. The maximal EZ(IS/OS)-CIZ and EZ(IS/OS)-RIZ response magnitudes doubled from 54% to 96% bleach. Both EZ(IS/OS)-RPE and EZ(IS/OS)-BM responses resembled dampened oscillations that were graded in amplitude and duration with bleaching intensity. Half-field photoresponses were localized to the stimulated retina. CONCLUSIONS. With noninvasive, near-infrared UHR-OCT, we characterized three distinct, spatially localized photoresponses in the outer retinal bands. These photoresponses have potential value as physical correlates of photoreceptor function. National Institutes of Health (U.S.) (Grant 5-R01-EY011289-30) National Institutes of Health (U.S.) (Grant UL1TR001064) United States. Air Force. Office of Scientific Research (Grant FA99550-12-1-0499) United States. Air Force. Office of Scientific Research (Grant FA9550-15-1-0473) 2018-03-21T17:44:45Z 2018-03-21T17:44:45Z 2017-09 2017-05 2018-02-23T14:44:46Z Article http://purl.org/eprint/type/JournalArticle 1552-5783 http://hdl.handle.net/1721.1/114249 Lu, Chen D. et al. “Photoreceptor Layer Thickness Changes During Dark Adaptation Observed With Ultrahigh-Resolution Optical Coherence Tomography.” Investigative Opthalmology & Visual Science 58, 11 (September 2017): 4632 © 2017 The Authors https://orcid.org/0000-0001-6235-0143 https://orcid.org/0000-0001-5262-2264 https://orcid.org/0000-0002-0828-4357 http://dx.doi.org/10.1167/IOVS.17-22171 Investigative Opthalmology & Visual Science Creative Commons Attribution 4.0 International License https://creativecommons.org/licenses/by/4.0/ application/pdf Association for Research in Vision and Ophthalmology (ARVO) Association for Research in Vision and Ophthalmology |
| spellingShingle | Schottenhamml, Julia Maier, Andreas Pugh, Edward N. Lu, Chen David Lee, ByungKun Fujimoto, James G Photoreceptor Layer Thickness Changes During Dark Adaptation Observed With Ultrahigh-Resolution Optical Coherence Tomography |
| title | Photoreceptor Layer Thickness Changes During Dark Adaptation Observed With Ultrahigh-Resolution Optical Coherence Tomography |
| title_full | Photoreceptor Layer Thickness Changes During Dark Adaptation Observed With Ultrahigh-Resolution Optical Coherence Tomography |
| title_fullStr | Photoreceptor Layer Thickness Changes During Dark Adaptation Observed With Ultrahigh-Resolution Optical Coherence Tomography |
| title_full_unstemmed | Photoreceptor Layer Thickness Changes During Dark Adaptation Observed With Ultrahigh-Resolution Optical Coherence Tomography |
| title_short | Photoreceptor Layer Thickness Changes During Dark Adaptation Observed With Ultrahigh-Resolution Optical Coherence Tomography |
| title_sort | photoreceptor layer thickness changes during dark adaptation observed with ultrahigh resolution optical coherence tomography |
| url | http://hdl.handle.net/1721.1/114249 https://orcid.org/0000-0001-6235-0143 https://orcid.org/0000-0001-5262-2264 https://orcid.org/0000-0002-0828-4357 |
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