Distance scaling of electric-field noise in a surface-electrode ion trap

We investigate anomalous ion-motional heating, a limitation to multiqubit quantum-logic gate fidelity in trapped-ion systems, as a function of ion-electrode separation. Using a multizone surface-electrode trap in which ions can be held at five discrete distances from the metal electrodes, we measure...

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Main Authors: Sedlacek, Jonathon, Greene, Amy L, Stuart, J. Scott, McConnell, Robert P., Bruzewicz, Colin D., Sage, Jeremy M., Chiaverini, John
Other Authors: Lincoln Laboratory
Format: Article
Language:English
Published: American Physical Society 2018
Online Access:http://hdl.handle.net/1721.1/114395
https://orcid.org/0000-0002-4034-8744
_version_ 1811083342506885120
author Sedlacek, Jonathon
Greene, Amy L
Stuart, J. Scott
McConnell, Robert P.
Bruzewicz, Colin D.
Sage, Jeremy M.
Chiaverini, John
author2 Lincoln Laboratory
author_facet Lincoln Laboratory
Sedlacek, Jonathon
Greene, Amy L
Stuart, J. Scott
McConnell, Robert P.
Bruzewicz, Colin D.
Sage, Jeremy M.
Chiaverini, John
author_sort Sedlacek, Jonathon
collection MIT
description We investigate anomalous ion-motional heating, a limitation to multiqubit quantum-logic gate fidelity in trapped-ion systems, as a function of ion-electrode separation. Using a multizone surface-electrode trap in which ions can be held at five discrete distances from the metal electrodes, we measure power-law dependencies of the electric-field noise experienced by the ion on the ion-electrode distance d. We find a scaling of approximately d^{−4} regardless of whether the electrodes are at room temperature or cryogenic temperature, despite the fact that the heating rates are approximately two orders of magnitude smaller in the latter case. Through auxiliary measurements using the application of noise to the electrodes, we rule out technical limitations to the measured heating rates and scalings. We also measure the frequency scaling of the inherent electric-field noise close to 1/f at both temperatures. These measurements eliminate from consideration anomalous-heating models which do not have a d⁻⁴ distance dependence, including several microscopic models of current interest.
first_indexed 2024-09-23T12:31:32Z
format Article
id mit-1721.1/114395
institution Massachusetts Institute of Technology
language English
last_indexed 2024-09-23T12:31:32Z
publishDate 2018
publisher American Physical Society
record_format dspace
spelling mit-1721.1/1143952022-10-01T09:34:44Z Distance scaling of electric-field noise in a surface-electrode ion trap Sedlacek, Jonathon Greene, Amy L Stuart, J. Scott McConnell, Robert P. Bruzewicz, Colin D. Sage, Jeremy M. Chiaverini, John Lincoln Laboratory Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology. Department of Physics Sedlacek, Jonathon Greene, Amy L Stuart, J. Scott McConnell, Robert P. Bruzewicz, Colin D. Sage, Jeremy M. Chiaverini, John We investigate anomalous ion-motional heating, a limitation to multiqubit quantum-logic gate fidelity in trapped-ion systems, as a function of ion-electrode separation. Using a multizone surface-electrode trap in which ions can be held at five discrete distances from the metal electrodes, we measure power-law dependencies of the electric-field noise experienced by the ion on the ion-electrode distance d. We find a scaling of approximately d^{−4} regardless of whether the electrodes are at room temperature or cryogenic temperature, despite the fact that the heating rates are approximately two orders of magnitude smaller in the latter case. Through auxiliary measurements using the application of noise to the electrodes, we rule out technical limitations to the measured heating rates and scalings. We also measure the frequency scaling of the inherent electric-field noise close to 1/f at both temperatures. These measurements eliminate from consideration anomalous-heating models which do not have a d⁻⁴ distance dependence, including several microscopic models of current interest. 2018-03-27T15:31:49Z 2018-03-27T15:31:49Z 2018-02 2017-12 2018-02-15T18:54:42Z Article http://purl.org/eprint/type/JournalArticle 2469-9926 2469-9934 http://hdl.handle.net/1721.1/114395 Sedlacek, J. A. et al. "Distance scaling of electric-field noise in a surface-electrode ion trap." Physical Review A 97, 2 (February 2018): 020302(R) © 2018 American Physical Society https://orcid.org/0000-0002-4034-8744 en http://dx.doi.org/10.1103/PhysRevA.97.020302 Physical Review A Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. American Physical Society application/pdf American Physical Society American Physical Society
spellingShingle Sedlacek, Jonathon
Greene, Amy L
Stuart, J. Scott
McConnell, Robert P.
Bruzewicz, Colin D.
Sage, Jeremy M.
Chiaverini, John
Distance scaling of electric-field noise in a surface-electrode ion trap
title Distance scaling of electric-field noise in a surface-electrode ion trap
title_full Distance scaling of electric-field noise in a surface-electrode ion trap
title_fullStr Distance scaling of electric-field noise in a surface-electrode ion trap
title_full_unstemmed Distance scaling of electric-field noise in a surface-electrode ion trap
title_short Distance scaling of electric-field noise in a surface-electrode ion trap
title_sort distance scaling of electric field noise in a surface electrode ion trap
url http://hdl.handle.net/1721.1/114395
https://orcid.org/0000-0002-4034-8744
work_keys_str_mv AT sedlacekjonathon distancescalingofelectricfieldnoiseinasurfaceelectrodeiontrap
AT greeneamyl distancescalingofelectricfieldnoiseinasurfaceelectrodeiontrap
AT stuartjscott distancescalingofelectricfieldnoiseinasurfaceelectrodeiontrap
AT mcconnellrobertp distancescalingofelectricfieldnoiseinasurfaceelectrodeiontrap
AT bruzewiczcolind distancescalingofelectricfieldnoiseinasurfaceelectrodeiontrap
AT sagejeremym distancescalingofelectricfieldnoiseinasurfaceelectrodeiontrap
AT chiaverinijohn distancescalingofelectricfieldnoiseinasurfaceelectrodeiontrap