APA (7th ed.) Citation

Scipioni, K. L., Wang, Z., Maximenko, Y., Katmis, F., Steiner, C., Madhavan, V., & Center, M. I. o. T. P. S. a. F. (2018). Role of defects in the carrier-tunable topological-insulator (Bi[subscript 1 − x]Sb[subscript x])[subscript 2]Te[subscript 3] thin films. American Physical Society.

Chicago Style (17th ed.) Citation

Scipioni, Kane L., Zhenyu Wang, Yulia Maximenko, Ferhat Katmis, Charlie Steiner, Vidya Madhavan, and Massachusetts Institute of Technology. Plasma Science and Fusion Center. Role of Defects in the Carrier-tunable Topological-insulator (Bi[subscript 1 − X]Sb[subscript X])[subscript 2]Te[subscript 3] Thin Films. American Physical Society, 2018.

MLA (9th ed.) Citation

Scipioni, Kane L., et al. Role of Defects in the Carrier-tunable Topological-insulator (Bi[subscript 1 − X]Sb[subscript X])[subscript 2]Te[subscript 3] Thin Films. American Physical Society, 2018.