Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
X-ray spectra provide a wealth of information on high temperature plasmas; for example electron temperature and density can be inferred from line intensity ratios. By using a Johann spectrometer viewing the plasma, it is possible to construct profiles of plasma parameters such as density, temperatur...
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MyJoVE Corporation
2018
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Online Access: | http://hdl.handle.net/1721.1/114999 https://orcid.org/0000-0001-9745-0275 https://orcid.org/0000-0001-8319-5971 |
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author | Cao, Norman Mier, Andres M. Rice, John E. |
author2 | Massachusetts Institute of Technology. Department of Nuclear Science and Engineering |
author_facet | Massachusetts Institute of Technology. Department of Nuclear Science and Engineering Cao, Norman Mier, Andres M. Rice, John E. |
author_sort | Cao, Norman |
collection | MIT |
description | X-ray spectra provide a wealth of information on high temperature plasmas; for example electron temperature and density can be inferred from line intensity ratios. By using a Johann spectrometer viewing the plasma, it is possible to construct profiles of plasma parameters such as density, temperature, and velocity with good spatial and time resolution. However, benchmarking atomic code modeling of X-ray spectra obtained from well-diagnosed laboratory plasmas is important to justify use of such spectra to determine plasma parameters when other independent diagnostics are not available. This manuscript presents the operation of the High Resolution X-ray Crystal Imaging Spectrometer with Spatial Resolution (HIREXSR), a high wavelength resolution spatially imaging X-ray spectrometer used to view hydrogen- and helium-like ions of medium atomic number elements in a tokamak plasma. In addition, this manuscript covers a laser blow-off system that can introduce such ions to the plasma with precise timing to allow for perturbative studies of transport in the plasma. Keywords: Engineering, Issue 114, X-Ray Spectroscopy, Crystal Spectroscopy, Plasma Physics, Fusion, Tokamaks, Plasma Diagnostics |
first_indexed | 2024-09-23T11:06:14Z |
format | Article |
id | mit-1721.1/114999 |
institution | Massachusetts Institute of Technology |
last_indexed | 2024-09-23T11:06:14Z |
publishDate | 2018 |
publisher | MyJoVE Corporation |
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spelling | mit-1721.1/1149992023-02-26T03:01:12Z Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic Cao, Norman Mier, Andres M. Rice, John E. Massachusetts Institute of Technology. Department of Nuclear Science and Engineering Massachusetts Institute of Technology. Department of Physics Massachusetts Institute of Technology. Plasma Science and Fusion Center Cao, Norman Mier, Andres M. Rice, John E X-ray spectra provide a wealth of information on high temperature plasmas; for example electron temperature and density can be inferred from line intensity ratios. By using a Johann spectrometer viewing the plasma, it is possible to construct profiles of plasma parameters such as density, temperature, and velocity with good spatial and time resolution. However, benchmarking atomic code modeling of X-ray spectra obtained from well-diagnosed laboratory plasmas is important to justify use of such spectra to determine plasma parameters when other independent diagnostics are not available. This manuscript presents the operation of the High Resolution X-ray Crystal Imaging Spectrometer with Spatial Resolution (HIREXSR), a high wavelength resolution spatially imaging X-ray spectrometer used to view hydrogen- and helium-like ions of medium atomic number elements in a tokamak plasma. In addition, this manuscript covers a laser blow-off system that can introduce such ions to the plasma with precise timing to allow for perturbative studies of transport in the plasma. Keywords: Engineering, Issue 114, X-Ray Spectroscopy, Crystal Spectroscopy, Plasma Physics, Fusion, Tokamaks, Plasma Diagnostics United States. Department of Energy (Contract DE-FC02-99ER54512) United States. Department of Energy (Contract DE-AC02-76CH03073) 2018-04-27T17:37:26Z 2018-04-27T17:37:26Z 2016-08 2018-02-23T17:15:25Z Article http://purl.org/eprint/type/JournalArticle 1940-087X http://hdl.handle.net/1721.1/114999 Cao, Norman M., et al. “Applying X-Ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic.” Journal of Visualized Experiments 114 (August 2016) © 2016 Journal of Visualized Experiments https://orcid.org/0000-0001-9745-0275 https://orcid.org/0000-0001-8319-5971 http://dx.doi.org/10.3791/54408 Journal of Visualized Experiments Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf MyJoVE Corporation Journal of Visualized Experiments |
spellingShingle | Cao, Norman Mier, Andres M. Rice, John E. Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic |
title | Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic |
title_full | Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic |
title_fullStr | Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic |
title_full_unstemmed | Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic |
title_short | Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic |
title_sort | applying x ray imaging crystal spectroscopy for use as a high temperature plasma diagnostic |
url | http://hdl.handle.net/1721.1/114999 https://orcid.org/0000-0001-9745-0275 https://orcid.org/0000-0001-8319-5971 |
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