Defect characterization of erbium doped silicon light emitting diodes
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1994.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2005
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| Online Access: | http://hdl.handle.net/1721.1/11695 |
| _version_ | 1826210535028293632 |
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| author | Gupta, Rita, 1970- |
| author2 | Lionel C. Kimerling. |
| author_facet | Lionel C. Kimerling. Gupta, Rita, 1970- |
| author_sort | Gupta, Rita, 1970- |
| collection | MIT |
| description | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1994. |
| first_indexed | 2024-09-23T14:51:30Z |
| format | Thesis |
| id | mit-1721.1/11695 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T14:51:30Z |
| publishDate | 2005 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/116952019-04-10T09:01:18Z Defect characterization of erbium doped silicon light emitting diodes Gupta, Rita, 1970- Lionel C. Kimerling. Massachusetts Institute of Technology. Dept. of Materials Science and Engineering Materials Science and Engineering Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1994. Includes bibliographical references (leaves 86-88). by Rita Gupta. M.S. 2005-08-16T23:42:27Z 2005-08-16T23:42:27Z 1994 1994 Thesis http://hdl.handle.net/1721.1/11695 32281241 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 88 leaves 6248000 bytes 6247760 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology |
| spellingShingle | Materials Science and Engineering Gupta, Rita, 1970- Defect characterization of erbium doped silicon light emitting diodes |
| title | Defect characterization of erbium doped silicon light emitting diodes |
| title_full | Defect characterization of erbium doped silicon light emitting diodes |
| title_fullStr | Defect characterization of erbium doped silicon light emitting diodes |
| title_full_unstemmed | Defect characterization of erbium doped silicon light emitting diodes |
| title_short | Defect characterization of erbium doped silicon light emitting diodes |
| title_sort | defect characterization of erbium doped silicon light emitting diodes |
| topic | Materials Science and Engineering |
| url | http://hdl.handle.net/1721.1/11695 |
| work_keys_str_mv | AT guptarita1970 defectcharacterizationoferbiumdopedsiliconlightemittingdiodes |