Defect characterization of erbium doped silicon light emitting diodes

Defect characterization of erbium doped silicon light emitting diodes

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1994.

Bibliographic Details
Main Author: Gupta, Rita, 1970-
Other Authors: Lionel C. Kimerling.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2005
Subjects:
Materials Science and Engineering
Online Access:http://hdl.handle.net/1721.1/11695

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