In situ TEM study of deformation-induced crystalline-to-amorphous transition in silicon
The mechanism responsible for deformation-induced crystalline-to-amorphous transition (CAT) in silicon is still under considerable debate, owing to the absence of direct experimental evidence. Here we have devised a novel core/shell configuration to impose confinement on the sample to circumvent ear...
| Main Authors: | , , , , , , |
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| Format: | Article |
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Springer Nature
2018
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| Online Access: | http://hdl.handle.net/1721.1/117061 https://orcid.org/0000-0002-7841-8058 |
| _version_ | 1811086017536458752 |
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| author | Zhang, Wei Zhuang, Zhuo Ma, En Shan, Zhi-Wei Wang, Yue-Cun Wang, Liyuan Li, Ju |
| author2 | Massachusetts Institute of Technology. Department of Brain and Cognitive Sciences |
| author_facet | Massachusetts Institute of Technology. Department of Brain and Cognitive Sciences Zhang, Wei Zhuang, Zhuo Ma, En Shan, Zhi-Wei Wang, Yue-Cun Wang, Liyuan Li, Ju |
| author_sort | Zhang, Wei |
| collection | MIT |
| description | The mechanism responsible for deformation-induced crystalline-to-amorphous transition (CAT) in silicon is still under considerable debate, owing to the absence of direct experimental evidence. Here we have devised a novel core/shell configuration to impose confinement on the sample to circumvent early cracking during uniaxial compression of submicron-sized Si pillars. This has enabled large plastic deformation and in situ monitoring of the CAT process inside a transmission electron microscope. We demonstrate that diamond cubic Si transforms into amorphous silicon through slip-mediated generation and storage of stacking faults (SFs), without involving any intermediate crystalline phases. By employing density functional theory simulations, we find that energetically unfavorable single-layer SFs create very strong antibonding interactions, which trigger the subsequent structural rearrangements. Our findings thus resolve the interrelationship between plastic deformation and amorphization in silicon, and shed light on the mechanism underlying deformation-induced CAT in general. |
| first_indexed | 2024-09-23T13:19:35Z |
| format | Article |
| id | mit-1721.1/117061 |
| institution | Massachusetts Institute of Technology |
| last_indexed | 2024-09-23T13:19:35Z |
| publishDate | 2018 |
| publisher | Springer Nature |
| record_format | dspace |
| spelling | mit-1721.1/1170612022-10-01T14:32:34Z In situ TEM study of deformation-induced crystalline-to-amorphous transition in silicon Zhang, Wei Zhuang, Zhuo Ma, En Shan, Zhi-Wei Wang, Yue-Cun Wang, Liyuan Li, Ju Massachusetts Institute of Technology. Department of Brain and Cognitive Sciences Massachusetts Institute of Technology. Department of Nuclear Science and Engineering Wang, Liyuan Li, Ju The mechanism responsible for deformation-induced crystalline-to-amorphous transition (CAT) in silicon is still under considerable debate, owing to the absence of direct experimental evidence. Here we have devised a novel core/shell configuration to impose confinement on the sample to circumvent early cracking during uniaxial compression of submicron-sized Si pillars. This has enabled large plastic deformation and in situ monitoring of the CAT process inside a transmission electron microscope. We demonstrate that diamond cubic Si transforms into amorphous silicon through slip-mediated generation and storage of stacking faults (SFs), without involving any intermediate crystalline phases. By employing density functional theory simulations, we find that energetically unfavorable single-layer SFs create very strong antibonding interactions, which trigger the subsequent structural rearrangements. Our findings thus resolve the interrelationship between plastic deformation and amorphization in silicon, and shed light on the mechanism underlying deformation-induced CAT in general. National Natural Science Foundation of China (grant 51231005) National Natural Science Foundation of China (grant 51321003) National Natural Science Foundation of China (grant 11132006) 2018-07-24T13:52:04Z 2018-07-24T13:52:04Z 2016-07 2016-04 2018-07-23T15:59:07Z Article http://purl.org/eprint/type/JournalArticle 1884-4049 1884-4057 http://hdl.handle.net/1721.1/117061 Wang, Yue-Cun, Wei Zhang, Li-Yuan Wang, Zhuo Zhuang, En Ma, Ju Li, and Zhi-Wei Shan. “In Situ TEM Study of Deformation-Induced Crystalline-to-Amorphous Transition in Silicon.” NPG Asia Materials 8, no. 7 (July 2016): e291–e291. https://orcid.org/0000-0002-7841-8058 http://dx.doi.org/10.1038/AM.2016.92 NPG Asia Materials Creative Commons Attribution 4.0 International License http://creativecommons.org/licenses/by/4.0/ application/pdf Springer Nature Nature |
| spellingShingle | Zhang, Wei Zhuang, Zhuo Ma, En Shan, Zhi-Wei Wang, Yue-Cun Wang, Liyuan Li, Ju In situ TEM study of deformation-induced crystalline-to-amorphous transition in silicon |
| title | In situ TEM study of deformation-induced crystalline-to-amorphous transition in silicon |
| title_full | In situ TEM study of deformation-induced crystalline-to-amorphous transition in silicon |
| title_fullStr | In situ TEM study of deformation-induced crystalline-to-amorphous transition in silicon |
| title_full_unstemmed | In situ TEM study of deformation-induced crystalline-to-amorphous transition in silicon |
| title_short | In situ TEM study of deformation-induced crystalline-to-amorphous transition in silicon |
| title_sort | in situ tem study of deformation induced crystalline to amorphous transition in silicon |
| url | http://hdl.handle.net/1721.1/117061 https://orcid.org/0000-0002-7841-8058 |
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