In situ TEM study of deformation-induced crystalline-to-amorphous transition in silicon

The mechanism responsible for deformation-induced crystalline-to-amorphous transition (CAT) in silicon is still under considerable debate, owing to the absence of direct experimental evidence. Here we have devised a novel core/shell configuration to impose confinement on the sample to circumvent ear...

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Bibliographic Details
Main Authors: Zhang, Wei, Zhuang, Zhuo, Ma, En, Shan, Zhi-Wei, Wang, Yue-Cun, Wang, Liyuan, Li, Ju
Other Authors: Massachusetts Institute of Technology. Department of Brain and Cognitive Sciences
Format: Article
Published: Springer Nature 2018
Online Access:http://hdl.handle.net/1721.1/117061
https://orcid.org/0000-0002-7841-8058

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