Sensitivity Analysis of Optical Metrics for Spectral Splitting Photovoltaic Systems: A Case Study
Spectral splitting of sunlight to increase photovoltaic (PV) efficiency beyond the Shockley-Queisser limit has gained interest in recent years. Sensitivity analysis can be a useful tool for system designers to determine how much deviation from ideal conditions can be tolerated for different optical...
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| Format: | Article |
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Institute of Electrical and Electronics Engineers (IEEE)
2018
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| Online Access: | http://hdl.handle.net/1721.1/119148 https://orcid.org/0000-0001-7857-9460 https://orcid.org/0000-0003-2239-6192 https://orcid.org/0000-0003-2785-552X https://orcid.org/0000-0002-3491-8341 https://orcid.org/0000-0001-8345-4937 |
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| author | Berney Needleman, David Mailoa, Jonathan P. Brandt, Riley E. Mangan, Niall M. Buonassisi, Tonio Mailoa, Jonathan P Brandt, Riley E Mangan, Niall Mari Buonassisi, Anthony |
| author2 | Massachusetts Institute of Technology. Department of Mechanical Engineering |
| author_facet | Massachusetts Institute of Technology. Department of Mechanical Engineering Berney Needleman, David Mailoa, Jonathan P. Brandt, Riley E. Mangan, Niall M. Buonassisi, Tonio Mailoa, Jonathan P Brandt, Riley E Mangan, Niall Mari Buonassisi, Anthony |
| author_sort | Berney Needleman, David |
| collection | MIT |
| description | Spectral splitting of sunlight to increase photovoltaic (PV) efficiency beyond the Shockley-Queisser limit has gained interest in recent years. Sensitivity analysis can be a useful tool for system designers to determine how much deviation from ideal conditions can be tolerated for different optical parameters. Understanding the origin of these sensitivities can offer insight into materials and device design. We employ 2-D TCAD simulations to analyze the sensitivity of system performance to two optical parameters: spectral fidelity (the fraction of photons directed to the intended material) and the spatial uniformity of illumination intensity. We analyze a system using crystalline silicon (Si) and cuprous oxide (Cu[subscript 2]O) as absorbers. We find that the spectral fidelity of the light directed to the Si cell has to be greater than 90% for the system to outperform a high-efficiency single-junction Si device. Varying the fidelity of the light directed to the Cu[subscript 2]O cell from 55% to 90% changes system efficiency by less than 10% relative. In some cases, increasing the fidelity of this light reduces system efficiency. We find no significant impact of spatial variation on length scales from 600 μm to 4.8 mm in devices with emitter sheet resistance less than 500 Ω/□. |
| first_indexed | 2024-09-23T10:37:19Z |
| format | Article |
| id | mit-1721.1/119148 |
| institution | Massachusetts Institute of Technology |
| last_indexed | 2024-09-23T10:37:19Z |
| publishDate | 2018 |
| publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| record_format | dspace |
| spelling | mit-1721.1/1191482022-09-27T10:06:57Z Sensitivity Analysis of Optical Metrics for Spectral Splitting Photovoltaic Systems: A Case Study Berney Needleman, David Mailoa, Jonathan P. Brandt, Riley E. Mangan, Niall M. Buonassisi, Tonio Mailoa, Jonathan P Brandt, Riley E Mangan, Niall Mari Buonassisi, Anthony Massachusetts Institute of Technology. Department of Mechanical Engineering Massachusetts Institute of Technology. Photovoltaic Research Laboratory Berney Needleman, David Mailoa, Jonathan P Brandt, Riley E Mangan, Niall Mari Buonassisi, Anthony Spectral splitting of sunlight to increase photovoltaic (PV) efficiency beyond the Shockley-Queisser limit has gained interest in recent years. Sensitivity analysis can be a useful tool for system designers to determine how much deviation from ideal conditions can be tolerated for different optical parameters. Understanding the origin of these sensitivities can offer insight into materials and device design. We employ 2-D TCAD simulations to analyze the sensitivity of system performance to two optical parameters: spectral fidelity (the fraction of photons directed to the intended material) and the spatial uniformity of illumination intensity. We analyze a system using crystalline silicon (Si) and cuprous oxide (Cu[subscript 2]O) as absorbers. We find that the spectral fidelity of the light directed to the Si cell has to be greater than 90% for the system to outperform a high-efficiency single-junction Si device. Varying the fidelity of the light directed to the Cu[subscript 2]O cell from 55% to 90% changes system efficiency by less than 10% relative. In some cases, increasing the fidelity of this light reduces system efficiency. We find no significant impact of spatial variation on length scales from 600 μm to 4.8 mm in devices with emitter sheet resistance less than 500 Ω/□. United States. Department of Defense. Assistant Secretary of Defense for Research & Engineering (Contract FA8721-05-C-0002) National Science Foundation (U.S.) (Contract ECCS-1102050) National Science Foundation (U.S.) (Singapore-MIT Alliance for Research and Technology (SMART)) American Society for Engineering Education. National Defense Science and Engineering Graduate Fellowship National Science Foundation (U.S.). Graduate Research Fellowship Program 2018-11-16T16:14:03Z 2018-11-16T16:14:03Z 2015-09 2018-10-31T15:41:45Z Article http://purl.org/eprint/type/JournalArticle 2156-3381 2156-3403 http://hdl.handle.net/1721.1/119148 Berney Needleman, David, et al. “Sensitivity Analysis of Optical Metrics for Spectral Splitting Photovoltaic Systems: A Case Study.” IEEE Journal of Photovoltaics, vol. 5, no. 5, Sept. 2015, pp. 1380–88. © 2011-2012 IEEE. https://orcid.org/0000-0001-7857-9460 https://orcid.org/0000-0003-2239-6192 https://orcid.org/0000-0003-2785-552X https://orcid.org/0000-0002-3491-8341 https://orcid.org/0000-0001-8345-4937 http://dx.doi.org/10.1109/JPHOTOV.2015.2457292 IEEE Journal of Photovoltaics Creative Commons Attribution-Noncommercial-Share Alike http://creativecommons.org/licenses/by-nc-sa/4.0/ application/pdf Institute of Electrical and Electronics Engineers (IEEE) Other repository |
| spellingShingle | Berney Needleman, David Mailoa, Jonathan P. Brandt, Riley E. Mangan, Niall M. Buonassisi, Tonio Mailoa, Jonathan P Brandt, Riley E Mangan, Niall Mari Buonassisi, Anthony Sensitivity Analysis of Optical Metrics for Spectral Splitting Photovoltaic Systems: A Case Study |
| title | Sensitivity Analysis of Optical Metrics for Spectral Splitting Photovoltaic Systems: A Case Study |
| title_full | Sensitivity Analysis of Optical Metrics for Spectral Splitting Photovoltaic Systems: A Case Study |
| title_fullStr | Sensitivity Analysis of Optical Metrics for Spectral Splitting Photovoltaic Systems: A Case Study |
| title_full_unstemmed | Sensitivity Analysis of Optical Metrics for Spectral Splitting Photovoltaic Systems: A Case Study |
| title_short | Sensitivity Analysis of Optical Metrics for Spectral Splitting Photovoltaic Systems: A Case Study |
| title_sort | sensitivity analysis of optical metrics for spectral splitting photovoltaic systems a case study |
| url | http://hdl.handle.net/1721.1/119148 https://orcid.org/0000-0001-7857-9460 https://orcid.org/0000-0003-2239-6192 https://orcid.org/0000-0003-2785-552X https://orcid.org/0000-0002-3491-8341 https://orcid.org/0000-0001-8345-4937 |
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