A Platform for Thermal Property Measurements and Transmission Electron Microscopy of Nanostructures
Measurements of the electrical and thermal transport properties of one-dimensional nanostructures (e.g., nanotubes and nanowires) typically are obtained without detailed knowledge of the specimens atomic-scale structure or defects. To address this deficiency, we have developed a microfabricated, chi...
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| Format: | Article |
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ASME International
2018
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| Online Access: | http://hdl.handle.net/1721.1/119198 https://orcid.org/0000-0002-3968-8530 |
| _version_ | 1826203011348692992 |
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| author | Harris, Tom Shaner, Eric Swartzentruber, Brian S. Huang, Jianyu Sullivan, John Martinez, Julio C Chen, Gang |
| author2 | Massachusetts Institute of Technology. Department of Mechanical Engineering |
| author_facet | Massachusetts Institute of Technology. Department of Mechanical Engineering Harris, Tom Shaner, Eric Swartzentruber, Brian S. Huang, Jianyu Sullivan, John Martinez, Julio C Chen, Gang |
| author_sort | Harris, Tom |
| collection | MIT |
| description | Measurements of the electrical and thermal transport properties of one-dimensional nanostructures (e.g., nanotubes and nanowires) typically are obtained without detailed knowledge of the specimens atomic-scale structure or defects. To address this deficiency, we have developed a microfabricated, chip-based characterization platform that enables both transmission electron microscopy (TEM) of atomic structure and defects as well as measurement of the thermal transport properties of individual nanostructures. The platform features a suspended heater line that contacts a suspended nanostructure/nanowire at its midpoint, which is placed on the platform using in-situ scanning electron microscope nanomanipulators. Because the nanostructure is suspended across a through-hole, we have used TEM to characterize the atomic and defect structure (dislocations, stacking faults, etc.) of the test sample. As a model study, we report the use of this platform to measure the thermal conductivity and defect structure of GaN nanowires. The utilization of this platform for the measurements of other nanostructures will also be discussed. |
| first_indexed | 2024-09-23T12:29:22Z |
| format | Article |
| id | mit-1721.1/119198 |
| institution | Massachusetts Institute of Technology |
| last_indexed | 2024-09-23T12:29:22Z |
| publishDate | 2018 |
| publisher | ASME International |
| record_format | dspace |
| spelling | mit-1721.1/1191982022-10-01T09:22:17Z A Platform for Thermal Property Measurements and Transmission Electron Microscopy of Nanostructures Harris, Tom Shaner, Eric Swartzentruber, Brian S. Huang, Jianyu Sullivan, John Martinez, Julio C Chen, Gang Massachusetts Institute of Technology. Department of Mechanical Engineering Massachusetts Institute of Technology. Department of Physics Martinez, Julio C Chen, Gang Measurements of the electrical and thermal transport properties of one-dimensional nanostructures (e.g., nanotubes and nanowires) typically are obtained without detailed knowledge of the specimens atomic-scale structure or defects. To address this deficiency, we have developed a microfabricated, chip-based characterization platform that enables both transmission electron microscopy (TEM) of atomic structure and defects as well as measurement of the thermal transport properties of individual nanostructures. The platform features a suspended heater line that contacts a suspended nanostructure/nanowire at its midpoint, which is placed on the platform using in-situ scanning electron microscope nanomanipulators. Because the nanostructure is suspended across a through-hole, we have used TEM to characterize the atomic and defect structure (dislocations, stacking faults, etc.) of the test sample. As a model study, we report the use of this platform to measure the thermal conductivity and defect structure of GaN nanowires. The utilization of this platform for the measurements of other nanostructures will also be discussed. National Science Foundation (U.S.). Science and Technology of Nanoporous Metal Films (Award No. 0506830) Sandia National Laboratories. Laboratory-Directed Research and Development (project) United States. National Nuclear Security Administration (contract DE-AC04-94AL85000) 2018-11-19T18:16:38Z 2018-11-19T18:16:38Z 2011-03 2018-11-06T18:05:02Z Article http://purl.org/eprint/type/ConferencePaper 978-0-7918-3892-1 http://hdl.handle.net/1721.1/119198 Harris, Tom, Julio Martinez, Eric Shaner, Brian S. Swartzentruber, Jianyu Huang, John Sullivan, and Gang Chen. “A Platform for Thermal Property Measurements and Transmission Electron Microscopy of Nanostructures.” ASME/JSME 2011 8th Thermal Engineering Joint Conference (2011). https://orcid.org/0000-0002-3968-8530 http://dx.doi.org/10.1115/AJTEC2011-44508 ASME/JSME 2011 8th Thermal Engineering Joint Conference Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf ASME International ASME |
| spellingShingle | Harris, Tom Shaner, Eric Swartzentruber, Brian S. Huang, Jianyu Sullivan, John Martinez, Julio C Chen, Gang A Platform for Thermal Property Measurements and Transmission Electron Microscopy of Nanostructures |
| title | A Platform for Thermal Property Measurements and Transmission Electron Microscopy of Nanostructures |
| title_full | A Platform for Thermal Property Measurements and Transmission Electron Microscopy of Nanostructures |
| title_fullStr | A Platform for Thermal Property Measurements and Transmission Electron Microscopy of Nanostructures |
| title_full_unstemmed | A Platform for Thermal Property Measurements and Transmission Electron Microscopy of Nanostructures |
| title_short | A Platform for Thermal Property Measurements and Transmission Electron Microscopy of Nanostructures |
| title_sort | platform for thermal property measurements and transmission electron microscopy of nanostructures |
| url | http://hdl.handle.net/1721.1/119198 https://orcid.org/0000-0002-3968-8530 |
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