A Platform for Thermal Property Measurements and Transmission Electron Microscopy of Nanostructures

A Platform for Thermal Property Measurements and Transmission Electron Microscopy of Nanostructures

Measurements of the electrical and thermal transport properties of one-dimensional nanostructures (e.g., nanotubes and nanowires) typically are obtained without detailed knowledge of the specimens atomic-scale structure or defects. To address this deficiency, we have developed a microfabricated, chi...

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Bibliographic Details
Main Authors: Harris, Tom, Shaner, Eric, Swartzentruber, Brian S., Huang, Jianyu, Sullivan, John, Martinez, Julio C, Chen, Gang
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering
Format: Article
Published: ASME International 2018
Online Access:http://hdl.handle.net/1721.1/119198
https://orcid.org/0000-0002-3968-8530

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