Probing Nanoscale Heat and Force Interactions Using Atomic Force Microscopes (AFM)
Many devices and instruments such as magnetic hard disk drives and atomic force microscopes (AFM) rely on the stable operation of their small probing heads at nanoscale gaps. Due to the small scale of the probing heads, the force interactions (Casimir force and electrostatic force) between the small...
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| Format: | Article |
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Begell House
2018
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| Online Access: | http://hdl.handle.net/1721.1/119199 https://orcid.org/0000-0002-9081-2314 https://orcid.org/0000-0002-3968-8530 |
| _version_ | 1826198590607851520 |
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| author | Chen, Gang Shen, Sheng Mavrokefalos, Anastassios Sambegoro, Poetro Lebdo |
| author2 | Massachusetts Institute of Technology. Department of Mechanical Engineering |
| author_facet | Massachusetts Institute of Technology. Department of Mechanical Engineering Chen, Gang Shen, Sheng Mavrokefalos, Anastassios Sambegoro, Poetro Lebdo |
| author_sort | Chen, Gang |
| collection | MIT |
| description | Many devices and instruments such as magnetic hard disk drives and atomic force microscopes (AFM) rely on the stable operation of their small probing heads at nanoscale gaps. Due to the small scale of the probing heads, the force interactions (Casimir force and electrostatic force) between the small probes and the surrounding become more significant. The local heating caused by read/write electric currents in hard disk drives or probing laser beams in AFM on the probes inevitably leads to the heat transfer between them and the surrounding. The nanoscale heat and force interactions play a critical role in the performances of those instruments. In this paper, we use a bimaterial AFM cantilever to measure the nanoscale air heat conduction, radiation and force between a microsphere and a substrate. The resulting "heat transfer-distance" and "force-distance" curves clearly show the strong dependence of nanoscale interactions with gap distances. |
| first_indexed | 2024-09-23T11:07:11Z |
| format | Article |
| id | mit-1721.1/119199 |
| institution | Massachusetts Institute of Technology |
| last_indexed | 2024-09-23T11:07:11Z |
| publishDate | 2018 |
| publisher | Begell House |
| record_format | dspace |
| spelling | mit-1721.1/1191992022-09-27T17:17:26Z Probing Nanoscale Heat and Force Interactions Using Atomic Force Microscopes (AFM) Chen, Gang Shen, Sheng Mavrokefalos, Anastassios Sambegoro, Poetro Lebdo Massachusetts Institute of Technology. Department of Mechanical Engineering MIT Energy Initiative Shen, Sheng Mavrokefalos, Anastassios Sambegoro, Poetro Lebdo Chen, Gang Many devices and instruments such as magnetic hard disk drives and atomic force microscopes (AFM) rely on the stable operation of their small probing heads at nanoscale gaps. Due to the small scale of the probing heads, the force interactions (Casimir force and electrostatic force) between the small probes and the surrounding become more significant. The local heating caused by read/write electric currents in hard disk drives or probing laser beams in AFM on the probes inevitably leads to the heat transfer between them and the surrounding. The nanoscale heat and force interactions play a critical role in the performances of those instruments. In this paper, we use a bimaterial AFM cantilever to measure the nanoscale air heat conduction, radiation and force between a microsphere and a substrate. The resulting "heat transfer-distance" and "force-distance" curves clearly show the strong dependence of nanoscale interactions with gap distances. 2018-11-19T18:37:20Z 2018-11-19T18:37:20Z 2018-11-19 2010-08 2018-11-06T17:55:20Z Article http://purl.org/eprint/type/ConferencePaper 978-0-7918-4941-5 http://hdl.handle.net/1721.1/119199 Shen, Sheng, Anastassios Mavrokefalos, Poetro Sambegoro, and Gang Chen. “Probing Nanoscale Heat and Force Interactions Using Atomic Force Microscopes (AFM).” 2010 14th International Heat Transfer Conference, Volume 6 (2010). https://orcid.org/0000-0002-9081-2314 https://orcid.org/0000-0002-3968-8530 http://dx.doi.org/10.1115/IHTC14-23329 2010 14th International Heat Transfer Conference, Volume 6 Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf Begell House ASME |
| spellingShingle | Chen, Gang Shen, Sheng Mavrokefalos, Anastassios Sambegoro, Poetro Lebdo Probing Nanoscale Heat and Force Interactions Using Atomic Force Microscopes (AFM) |
| title | Probing Nanoscale Heat and Force Interactions Using Atomic Force Microscopes (AFM) |
| title_full | Probing Nanoscale Heat and Force Interactions Using Atomic Force Microscopes (AFM) |
| title_fullStr | Probing Nanoscale Heat and Force Interactions Using Atomic Force Microscopes (AFM) |
| title_full_unstemmed | Probing Nanoscale Heat and Force Interactions Using Atomic Force Microscopes (AFM) |
| title_short | Probing Nanoscale Heat and Force Interactions Using Atomic Force Microscopes (AFM) |
| title_sort | probing nanoscale heat and force interactions using atomic force microscopes afm |
| url | http://hdl.handle.net/1721.1/119199 https://orcid.org/0000-0002-9081-2314 https://orcid.org/0000-0002-3968-8530 |
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