Real time in-situ monitoring and control of silicon epitaxy by Fourier transform infrared spectroscopy

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1994.

Bibliographic Details
Main Author: Zhou, Zen-Hong
Other Authors: Rafael Reif.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2005
Subjects:
Online Access:http://hdl.handle.net/1721.1/12011
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author Zhou, Zen-Hong
author2 Rafael Reif.
author_facet Rafael Reif.
Zhou, Zen-Hong
author_sort Zhou, Zen-Hong
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description Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1994.
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spelling mit-1721.1/120112019-04-10T18:36:16Z Real time in-situ monitoring and control of silicon epitaxy by Fourier transform infrared spectroscopy Zhou, Zen-Hong Rafael Reif. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science Electrical Engineering and Computer Science Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1994. Includes bibliographical references (p. 170-182). by Zhen-Hong Zhou. Ph.D. 2005-08-16T21:52:46Z 2005-08-16T21:52:46Z 1994 1994 Thesis http://hdl.handle.net/1721.1/12011 31262733 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 182 p. 14400038 bytes 14399798 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology
spellingShingle Electrical Engineering and Computer Science
Zhou, Zen-Hong
Real time in-situ monitoring and control of silicon epitaxy by Fourier transform infrared spectroscopy
title Real time in-situ monitoring and control of silicon epitaxy by Fourier transform infrared spectroscopy
title_full Real time in-situ monitoring and control of silicon epitaxy by Fourier transform infrared spectroscopy
title_fullStr Real time in-situ monitoring and control of silicon epitaxy by Fourier transform infrared spectroscopy
title_full_unstemmed Real time in-situ monitoring and control of silicon epitaxy by Fourier transform infrared spectroscopy
title_short Real time in-situ monitoring and control of silicon epitaxy by Fourier transform infrared spectroscopy
title_sort real time in situ monitoring and control of silicon epitaxy by fourier transform infrared spectroscopy
topic Electrical Engineering and Computer Science
url http://hdl.handle.net/1721.1/12011
work_keys_str_mv AT zhouzenhong realtimeinsitumonitoringandcontrolofsiliconepitaxybyfouriertransforminfraredspectroscopy