Metrics for measuring the value of computer integrated manufacturing (CIM) systems
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1994, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering, 1994
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2005
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| Online Access: | http://hdl.handle.net/1721.1/12062 |
| _version_ | 1826211156082032640 |
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| author | Crandall, William W |
| author2 | John V. Guttag, Michael A. Cusumano. |
| author_facet | John V. Guttag, Michael A. Cusumano. Crandall, William W |
| author_sort | Crandall, William W |
| collection | MIT |
| description | Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1994, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering, 1994 |
| first_indexed | 2024-09-23T15:01:27Z |
| format | Thesis |
| id | mit-1721.1/12062 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T15:01:27Z |
| publishDate | 2005 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/120622022-01-27T16:54:00Z Metrics for measuring the value of computer integrated manufacturing (CIM) systems Crandall, William W John V. Guttag, Michael A. Cusumano. Massachusetts Institute of Technology. Department of Electrical Engineering Sloan School of Management Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Sloan School of Management Electrical Engineering Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1994, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering, 1994 Includes bibliographical references (leaves 129-136). by William Wofford Crandall, Jr. M.S. 2005-08-16T22:14:13Z 2005-08-16T22:14:13Z 1994 1994 Thesis http://hdl.handle.net/1721.1/12062 31449395 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 136 leaves 11120813 bytes 11120574 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology |
| spellingShingle | Sloan School of Management Electrical Engineering Crandall, William W Metrics for measuring the value of computer integrated manufacturing (CIM) systems |
| title | Metrics for measuring the value of computer integrated manufacturing (CIM) systems |
| title_full | Metrics for measuring the value of computer integrated manufacturing (CIM) systems |
| title_fullStr | Metrics for measuring the value of computer integrated manufacturing (CIM) systems |
| title_full_unstemmed | Metrics for measuring the value of computer integrated manufacturing (CIM) systems |
| title_short | Metrics for measuring the value of computer integrated manufacturing (CIM) systems |
| title_sort | metrics for measuring the value of computer integrated manufacturing cim systems |
| topic | Sloan School of Management Electrical Engineering |
| url | http://hdl.handle.net/1721.1/12062 |
| work_keys_str_mv | AT crandallwilliamw metricsformeasuringthevalueofcomputerintegratedmanufacturingcimsystems |