Evidence for multiple mechanisms underlying surface electric-field noise in ion traps
Electric-field noise from ion-trap electrode surfaces can limit the fidelity of multiqubit entangling operations in trapped-ion quantum information processors and can give rise to systematic errors in trapped-ion optical clocks. The underlying mechanism for this noise is unknown, but it has been sho...
| Main Authors: | , , , , , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
American Physical Society
2019
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| Online Access: | http://hdl.handle.net/1721.1/120947 https://orcid.org/0000-0001-5863-109X |