Three-dimensional super-resolution high-throughput imaging by structured illumination STED microscopy
Stimulated emission depletion (STED) microscopy is able to image fluorescence labeled samples with nanometer scale resolution. STED microscopy is typically a point-scanning method, limited by the high intensity requirement of the depletion beam. With the development of high peak power lasers, two di...
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| Format: | Article |
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Optical Society of America
2019
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| Online Access: | http://hdl.handle.net/1721.1/121044 https://orcid.org/0000-0003-4831-0932 https://orcid.org/0000-0003-4698-6488 |