Statistical metrology and process control of quantum devices

Statistical metrology and process control of quantum devices

Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, May, 2020

Bibliographic Details
Main Author:	Walsh, Michael P.,Ph. D.Massachusetts Institute of Technology.
Other Authors:	Dirk R. Englund.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2020
Subjects:	Electrical Engineering and Computer Science.
Online Access:	https://hdl.handle.net/1721.1/126998

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