Single-frame far-field diffractive imaging with randomized illumination
We introduce a single-frame diffractive imaging method called randomized probe imaging (RPI). In RPI, a sample is illuminated by a structured probe field containing speckles smaller than the sample’s typical feature size. Quantitative amplitude and phase images are then reconstructed from the result...
| Main Authors: | , , , , |
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| Format: | Article |
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The Optical Society
2020
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| Online Access: | https://hdl.handle.net/1721.1/128706 |
| _version_ | 1826199041162084352 |
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| author | Levitan, Abraham Keskinbora, Kahraman Sanli, Umut T. Weigand, Markus Comin, Riccardo |
| author2 | Massachusetts Institute of Technology. Department of Physics |
| author_facet | Massachusetts Institute of Technology. Department of Physics Levitan, Abraham Keskinbora, Kahraman Sanli, Umut T. Weigand, Markus Comin, Riccardo |
| author_sort | Levitan, Abraham |
| collection | MIT |
| description | We introduce a single-frame diffractive imaging method called randomized probe imaging (RPI). In RPI, a sample is illuminated by a structured probe field containing speckles smaller than the sample’s typical feature size. Quantitative amplitude and phase images are then reconstructed from the resulting far-field diffraction pattern. The experimental geometry of RPI is straightforward to implement, requires no near-field optics, and is applicable to extended samples. When the resulting data are analyzed with a complimentary algorithm, reliable reconstructions which are robust to missing data are achieved. To realize these benefits, a resolution limit associated with the numerical aperture of the probe-forming optics is imposed. RPI therefore offers an attractive modality for quantitative X-ray phase imaging when temporal resolution and reliability are critical but spatial resolution in the tens of nanometers is sufficient. We discuss the method, introduce a reconstruction algorithm, and present two proof-of-concept experiments: one using visible light, and one using soft X-rays. |
| first_indexed | 2024-09-23T11:13:48Z |
| format | Article |
| id | mit-1721.1/128706 |
| institution | Massachusetts Institute of Technology |
| last_indexed | 2024-09-23T11:13:48Z |
| publishDate | 2020 |
| publisher | The Optical Society |
| record_format | dspace |
| spelling | mit-1721.1/1287062022-10-01T02:14:18Z Single-frame far-field diffractive imaging with randomized illumination Levitan, Abraham Keskinbora, Kahraman Sanli, Umut T. Weigand, Markus Comin, Riccardo Massachusetts Institute of Technology. Department of Physics We introduce a single-frame diffractive imaging method called randomized probe imaging (RPI). In RPI, a sample is illuminated by a structured probe field containing speckles smaller than the sample’s typical feature size. Quantitative amplitude and phase images are then reconstructed from the resulting far-field diffraction pattern. The experimental geometry of RPI is straightforward to implement, requires no near-field optics, and is applicable to extended samples. When the resulting data are analyzed with a complimentary algorithm, reliable reconstructions which are robust to missing data are achieved. To realize these benefits, a resolution limit associated with the numerical aperture of the probe-forming optics is imposed. RPI therefore offers an attractive modality for quantitative X-ray phase imaging when temporal resolution and reliability are critical but spatial resolution in the tens of nanometers is sufficient. We discuss the method, introduce a reconstruction algorithm, and present two proof-of-concept experiments: one using visible light, and one using soft X-rays. National Science Foundation (Grants 1751739, DMR-1231319) Department of Energy, Office of Science (DE-SC0019126) 2020-12-01T22:01:05Z 2020-12-01T22:01:05Z 2020-11 2020-10 Article http://purl.org/eprint/type/JournalArticle 1094-4087 https://hdl.handle.net/1721.1/128706 Levitan, Abraham et al. "Single-frame far-field diffractive imaging with randomized illumination." Optics Express 28, 25 (November 2020): 37103-37117 © 2020 Optical Society of America http://dx.doi.org/10.1364/oe.397421 Optics Express Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf The Optical Society Prof. Comin |
| spellingShingle | Levitan, Abraham Keskinbora, Kahraman Sanli, Umut T. Weigand, Markus Comin, Riccardo Single-frame far-field diffractive imaging with randomized illumination |
| title | Single-frame far-field diffractive imaging with randomized illumination |
| title_full | Single-frame far-field diffractive imaging with randomized illumination |
| title_fullStr | Single-frame far-field diffractive imaging with randomized illumination |
| title_full_unstemmed | Single-frame far-field diffractive imaging with randomized illumination |
| title_short | Single-frame far-field diffractive imaging with randomized illumination |
| title_sort | single frame far field diffractive imaging with randomized illumination |
| url | https://hdl.handle.net/1721.1/128706 |
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