Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination
Interaction-free measurement (IFM) has been proposed as a means of high-resolution, low-damage imaging of radiation-sensitive samples, such as biomolecules and proteins. The basic setup for IFM is a Mach-Zehnder interferometer, and recent progress in nanofabricated electron-diffraction gratings has...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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American Physical Society (APS)
2020
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| Online Access: | https://hdl.handle.net/1721.1/128716 |
| _version_ | 1826190841682591744 |
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| author | Agarwal, Akshay Berggren, Karl K van Staaden, Yuri J. Goyal, Vivek K. |
| author2 | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science |
| author_facet | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Agarwal, Akshay Berggren, Karl K van Staaden, Yuri J. Goyal, Vivek K. |
| author_sort | Agarwal, Akshay |
| collection | MIT |
| description | Interaction-free measurement (IFM) has been proposed as a means of high-resolution, low-damage imaging of radiation-sensitive samples, such as biomolecules and proteins. The basic setup for IFM is a Mach-Zehnder interferometer, and recent progress in nanofabricated electron-diffraction gratings has made it possible to incorporate a Mach-Zehnder interferometer in a transmission electron microscope (TEM). Therefore, the limits of performance of IFM with such an interferometer and a shot-noise limited electron source (such as that in a TEM) are of interest. In this paper, we compare the error probability and sample damage for ideal IFM and classical imaging schemes, through theoretical analysis and numerical simulation. We consider a sample that is either completely transparent or completely opaque at each pixel. In our analysis, we also evaluate the impact of an additional detector for scattered electrons. Inclusion of the scattering detector results in reduction of error by up to an order of magnitude, for both IFM and classical schemes. We also investigate a sample reillumination scheme based on updating priors after each round of illumination and find that this scheme further reduces error. Implementation of these methods is likely achievable with existing instrumentation and would result in improved resolution in low-dose electron microscopy. |
| first_indexed | 2024-09-23T08:46:29Z |
| format | Article |
| id | mit-1721.1/128716 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T08:46:29Z |
| publishDate | 2020 |
| publisher | American Physical Society (APS) |
| record_format | dspace |
| spelling | mit-1721.1/1287162022-09-30T11:10:28Z Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination Agarwal, Akshay Berggren, Karl K van Staaden, Yuri J. Goyal, Vivek K. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Interaction-free measurement (IFM) has been proposed as a means of high-resolution, low-damage imaging of radiation-sensitive samples, such as biomolecules and proteins. The basic setup for IFM is a Mach-Zehnder interferometer, and recent progress in nanofabricated electron-diffraction gratings has made it possible to incorporate a Mach-Zehnder interferometer in a transmission electron microscope (TEM). Therefore, the limits of performance of IFM with such an interferometer and a shot-noise limited electron source (such as that in a TEM) are of interest. In this paper, we compare the error probability and sample damage for ideal IFM and classical imaging schemes, through theoretical analysis and numerical simulation. We consider a sample that is either completely transparent or completely opaque at each pixel. In our analysis, we also evaluate the impact of an additional detector for scattered electrons. Inclusion of the scattering detector results in reduction of error by up to an order of magnitude, for both IFM and classical schemes. We also investigate a sample reillumination scheme based on updating priors after each round of illumination and find that this scheme further reduces error. Implementation of these methods is likely achievable with existing instrumentation and would result in improved resolution in low-dose electron microscopy. NSF (Grants 1422034 and 1815896) 2020-12-02T21:32:31Z 2020-12-02T21:32:31Z 2019-06 2019-01 2020-12-02T15:00:32Z Article http://purl.org/eprint/type/JournalArticle 2469-9926 2469-9934 https://hdl.handle.net/1721.1/128716 Agarwal, Akshay et al. "Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination." Physical Review A 99, 6 (June 2019): 063809 © 2019 American Physical Society en http://dx.doi.org/10.1103/physreva.99.063809 Physical Review A Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Physical Society (APS) APS |
| spellingShingle | Agarwal, Akshay Berggren, Karl K van Staaden, Yuri J. Goyal, Vivek K. Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination |
| title | Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination |
| title_full | Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination |
| title_fullStr | Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination |
| title_full_unstemmed | Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination |
| title_short | Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination |
| title_sort | reduced damage in electron microscopy by using interaction free measurement and conditional reillumination |
| url | https://hdl.handle.net/1721.1/128716 |
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