Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination
Interaction-free measurement (IFM) has been proposed as a means of high-resolution, low-damage imaging of radiation-sensitive samples, such as biomolecules and proteins. The basic setup for IFM is a Mach-Zehnder interferometer, and recent progress in nanofabricated electron-diffraction gratings has...
Main Authors: | Agarwal, Akshay, Berggren, Karl K, van Staaden, Yuri J., Goyal, Vivek K. |
---|---|
Other Authors: | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science |
Format: | Article |
Language: | English |
Published: |
American Physical Society (APS)
2020
|
Online Access: | https://hdl.handle.net/1721.1/128716 |
Similar Items
-
Source Shot Noise Mitigation in Focused Ion Beam Microscopy by Time-Resolved Measurement
by: Peng, Minxu, et al.
Published: (2021) -
Image-histogram-based secondary electron counting to evaluate detective quantum efficiency in SEM
by: Agarwal, Akshay, et al.
Published: (2022) -
Techniques for Reducing Beam-Induced Damage in Electron Microscopy
by: Abedzadeh, Navid
Published: (2022) -
A nanofabricated, monolithic, path-separated electron interferometer
by: Dyck, Dirk van, et al.
Published: (2017) -
Efficient two-port electron beam splitter via a quantum interaction-free measurement
by: Yang, Yujia, et al.
Published: (2018)