Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination

Interaction-free measurement (IFM) has been proposed as a means of high-resolution, low-damage imaging of radiation-sensitive samples, such as biomolecules and proteins. The basic setup for IFM is a Mach-Zehnder interferometer, and recent progress in nanofabricated electron-diffraction gratings has...

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Bibliographic Details
Main Authors: Agarwal, Akshay, Berggren, Karl K, van Staaden, Yuri J., Goyal, Vivek K.
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Format: Article
Language:English
Published: American Physical Society (APS) 2020
Online Access:https://hdl.handle.net/1721.1/128716

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