Thermal annealing effects on boron-implanted HgCdTe diodes
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1988.
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| Format: | Thesis |
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Massachusetts Institute of Technology
2021
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| Online Access: | https://hdl.handle.net/1721.1/129636 |
| _version_ | 1811074077556736000 |
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| author | Syz, Jing-Kai. |
| author2 | Robert H. Kingston. |
| author_facet | Robert H. Kingston. Syz, Jing-Kai. |
| author_sort | Syz, Jing-Kai. |
| collection | MIT |
| description | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1988. |
| first_indexed | 2024-09-23T09:42:48Z |
| format | Thesis |
| id | mit-1721.1/129636 |
| institution | Massachusetts Institute of Technology |
| last_indexed | 2024-09-23T09:42:48Z |
| publishDate | 2021 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/1296362021-02-03T03:31:15Z Thermal annealing effects on boron-implanted HgCdTe diodes Syz, Jing-Kai. Robert H. Kingston. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Electrical Engineering and Computer Science. Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1988. Vita. Bibliography: leaves 114-117. by Jing-Kai Syz. Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1988. 2021-02-02T18:54:34Z 2021-02-02T18:54:34Z 1988 1988 Thesis https://hdl.handle.net/1721.1/129636 18720614 MIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided. http://dspace.mit.edu/handle/1721.1/7582 118 leaves application/pdf Massachusetts Institute of Technology |
| spellingShingle | Electrical Engineering and Computer Science. Syz, Jing-Kai. Thermal annealing effects on boron-implanted HgCdTe diodes |
| title | Thermal annealing effects on boron-implanted HgCdTe diodes |
| title_full | Thermal annealing effects on boron-implanted HgCdTe diodes |
| title_fullStr | Thermal annealing effects on boron-implanted HgCdTe diodes |
| title_full_unstemmed | Thermal annealing effects on boron-implanted HgCdTe diodes |
| title_short | Thermal annealing effects on boron-implanted HgCdTe diodes |
| title_sort | thermal annealing effects on boron implanted hgcdte diodes |
| topic | Electrical Engineering and Computer Science. |
| url | https://hdl.handle.net/1721.1/129636 |
| work_keys_str_mv | AT syzjingkai thermalannealingeffectsonboronimplantedhgcdtediodes |