Imaging resonant dissipation from individual atomic defects in graphene
Conversion of electric current into heat involves microscopic processes that operate on nanometer length scales and release minute amounts of power. Although central to our understanding of the electrical properties of materials, individual mediators of energy dissipation have so far eluded direct o...
| Main Authors: | , , , , , , , , , , |
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| Format: | Article |
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American Association for the Advancement of Science (AAAS)
2021
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| Online Access: | https://hdl.handle.net/1721.1/129691 |
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| author | Halbertal, Dorri Ben Shalom, Moshe Uri, Aviram Bagani, Kousik Meltzer, Alexander Y. Marcus, Ido Myasoedov, Yuri Birkbeck, John Levitov, Leonid Geim, Andre K. Zeldov, Eli |
| author2 | Massachusetts Institute of Technology. Department of Physics |
| author_facet | Massachusetts Institute of Technology. Department of Physics Halbertal, Dorri Ben Shalom, Moshe Uri, Aviram Bagani, Kousik Meltzer, Alexander Y. Marcus, Ido Myasoedov, Yuri Birkbeck, John Levitov, Leonid Geim, Andre K. Zeldov, Eli |
| author_sort | Halbertal, Dorri |
| collection | MIT |
| description | Conversion of electric current into heat involves microscopic processes that operate on nanometer length scales and release minute amounts of power. Although central to our understanding of the electrical properties of materials, individual mediators of energy dissipation have so far eluded direct observation. Using scanning nanothermometry with submicrokelvin sensitivity, we visualized and controlled phonon emission from individual atomic-scale defects in graphene. The inferred electron-phonon “cooling power spectrum” exhibits sharp peaks when the Fermi level comes into resonance with electronic quasi-bound states at such defects. Rare in the bulk but abundant at graphene’s edges, switchable atomic-scale phonon emitters provide the dominant dissipation mechanism. Our work offers insights for addressing key materials challenges in modern electronics and enables control of dissipation at the nanoscale. |
| first_indexed | 2024-09-23T09:05:33Z |
| format | Article |
| id | mit-1721.1/129691 |
| institution | Massachusetts Institute of Technology |
| last_indexed | 2024-09-23T09:05:33Z |
| publishDate | 2021 |
| publisher | American Association for the Advancement of Science (AAAS) |
| record_format | dspace |
| spelling | mit-1721.1/1296912022-09-30T13:24:08Z Imaging resonant dissipation from individual atomic defects in graphene Halbertal, Dorri Ben Shalom, Moshe Uri, Aviram Bagani, Kousik Meltzer, Alexander Y. Marcus, Ido Myasoedov, Yuri Birkbeck, John Levitov, Leonid Geim, Andre K. Zeldov, Eli Massachusetts Institute of Technology. Department of Physics Conversion of electric current into heat involves microscopic processes that operate on nanometer length scales and release minute amounts of power. Although central to our understanding of the electrical properties of materials, individual mediators of energy dissipation have so far eluded direct observation. Using scanning nanothermometry with submicrokelvin sensitivity, we visualized and controlled phonon emission from individual atomic-scale defects in graphene. The inferred electron-phonon “cooling power spectrum” exhibits sharp peaks when the Fermi level comes into resonance with electronic quasi-bound states at such defects. Rare in the bulk but abundant at graphene’s edges, switchable atomic-scale phonon emitters provide the dominant dissipation mechanism. Our work offers insights for addressing key materials challenges in modern electronics and enables control of dissipation at the nanoscale. 2021-02-05T19:02:29Z 2021-02-05T19:02:29Z 2017-12 2017-07 2019-03-29T15:22:58Z Article http://purl.org/eprint/type/JournalArticle 0036-8075 1095-9203 https://hdl.handle.net/1721.1/129691 Halbertal, Dorri et al. “Imaging Resonant Dissipation from Individual Atomic Defects in Graphene.” Science 358, 6368 (December 2017): 1303–1306. © 2017 American Association for the Advancement of Science http://dx.doi.org/10.1126/SCIENCE.AAN0877 Science Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Association for the Advancement of Science (AAAS) arXiv |
| spellingShingle | Halbertal, Dorri Ben Shalom, Moshe Uri, Aviram Bagani, Kousik Meltzer, Alexander Y. Marcus, Ido Myasoedov, Yuri Birkbeck, John Levitov, Leonid Geim, Andre K. Zeldov, Eli Imaging resonant dissipation from individual atomic defects in graphene |
| title | Imaging resonant dissipation from individual atomic defects in graphene |
| title_full | Imaging resonant dissipation from individual atomic defects in graphene |
| title_fullStr | Imaging resonant dissipation from individual atomic defects in graphene |
| title_full_unstemmed | Imaging resonant dissipation from individual atomic defects in graphene |
| title_short | Imaging resonant dissipation from individual atomic defects in graphene |
| title_sort | imaging resonant dissipation from individual atomic defects in graphene |
| url | https://hdl.handle.net/1721.1/129691 |
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