1/f noise in MOSFETs with ultrathin gate dielectrics

1/f noise in MOSFETs with ultrathin gate dielectrics

Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 1992

Bibliographic Details
Main Author:	Gross, Blaine Jeffrey.
Other Authors:	Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Format:	Thesis
Published:	Massachusetts Institute of Technology 2005
Subjects:	Electrical Engineering and Computer Science
Online Access:	http://hdl.handle.net/1721.1/13192

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