Deep‐Learning‐Enabled Fast Optical Identification and Characterization of 2D Materials

Deep‐Learning‐Enabled Fast Optical Identification and Characterization of 2D Materials

© 2020 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim Advanced microscopy and/or spectroscopy tools play indispensable roles in nanoscience and nanotechnology research, as they provide rich information about material processes and properties. However, the interpretation of imaging data heavily rel...

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Bibliographic Details
Main Authors: Han, Bingnan, Lin, Yuxuan, Yang, Yafang, Mao, Nannan, Li, Wenyue, Wang, Haozhe, Yasuda, Kenji, Wang, Xirui, Fatemi, Valla, Zhou, Lin, Wang, Joel I-Jan, Ma, Qiong, Cao, Yuan, Rodan-Legrain, Daniel, Bie, Ya-Qing, Navarro-Moratalla, Efrén, Klein, Dahlia, MacNeill, David, Wu, Sanfeng, Kitadai, Hikari, Ling, Xi, Jarillo-Herrero, Pablo, Kong, Jing, Yin, Jihao, Palacios, Tomás
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Format: Article
Language:English
Published: Wiley 2021
Online Access:https://hdl.handle.net/1721.1/133692

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