Determining Interface Dielectric Losses in Superconducting Coplanar-Waveguide Resonators
© 2019 American Physical Society. Superconducting quantum-computing architectures comprise resonators and qubits that experience energy loss due to two-level systems (TLSs) in bulk and interfacial dielectrics. An understanding of these losses is critical to improving performance in superconducting c...
| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
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American Physical Society (APS)
2021
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| Online Access: | https://hdl.handle.net/1721.1/134795 |
| _version_ | 1826191929331679232 |
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| author | Woods, W Calusine, G Melville, A Sevi, A Golden, E Kim, DK Rosenberg, D Yoder, JL Oliver, WD |
| author2 | Lincoln Laboratory |
| author_facet | Lincoln Laboratory Woods, W Calusine, G Melville, A Sevi, A Golden, E Kim, DK Rosenberg, D Yoder, JL Oliver, WD |
| author_sort | Woods, W |
| collection | MIT |
| description | © 2019 American Physical Society. Superconducting quantum-computing architectures comprise resonators and qubits that experience energy loss due to two-level systems (TLSs) in bulk and interfacial dielectrics. An understanding of these losses is critical to improving performance in superconducting circuits. In this work, we present a method for quantifying the TLS losses of different bulk and interfacial dielectrics present in superconducting coplanar-waveguide (CPW) resonators. By combining statistical characterization of sets of specifically designed CPW resonators on isotropically etched silicon substrates with detailed electromagnetic modeling, we determine the separate loss contributions from individual material interfaces and bulk dielectrics. This technique for analyzing interfacial TLS losses can be used to guide targeted improvements to qubits, resonators, and their superconducting fabrication processes. |
| first_indexed | 2024-09-23T09:03:10Z |
| format | Article |
| id | mit-1721.1/134795 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T09:03:10Z |
| publishDate | 2021 |
| publisher | American Physical Society (APS) |
| record_format | dspace |
| spelling | mit-1721.1/1347952023-03-01T20:08:30Z Determining Interface Dielectric Losses in Superconducting Coplanar-Waveguide Resonators Woods, W Calusine, G Melville, A Sevi, A Golden, E Kim, DK Rosenberg, D Yoder, JL Oliver, WD Lincoln Laboratory Massachusetts Institute of Technology. Research Laboratory of Electronics Massachusetts Institute of Technology. Department of Physics © 2019 American Physical Society. Superconducting quantum-computing architectures comprise resonators and qubits that experience energy loss due to two-level systems (TLSs) in bulk and interfacial dielectrics. An understanding of these losses is critical to improving performance in superconducting circuits. In this work, we present a method for quantifying the TLS losses of different bulk and interfacial dielectrics present in superconducting coplanar-waveguide (CPW) resonators. By combining statistical characterization of sets of specifically designed CPW resonators on isotropically etched silicon substrates with detailed electromagnetic modeling, we determine the separate loss contributions from individual material interfaces and bulk dielectrics. This technique for analyzing interfacial TLS losses can be used to guide targeted improvements to qubits, resonators, and their superconducting fabrication processes. 2021-10-27T20:09:12Z 2021-10-27T20:09:12Z 2019 2021-03-29T14:25:08Z Article http://purl.org/eprint/type/JournalArticle https://hdl.handle.net/1721.1/134795 en 10.1103/PHYSREVAPPLIED.12.014012 Physical Review Applied Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Physical Society (APS) APS |
| spellingShingle | Woods, W Calusine, G Melville, A Sevi, A Golden, E Kim, DK Rosenberg, D Yoder, JL Oliver, WD Determining Interface Dielectric Losses in Superconducting Coplanar-Waveguide Resonators |
| title | Determining Interface Dielectric Losses in Superconducting Coplanar-Waveguide Resonators |
| title_full | Determining Interface Dielectric Losses in Superconducting Coplanar-Waveguide Resonators |
| title_fullStr | Determining Interface Dielectric Losses in Superconducting Coplanar-Waveguide Resonators |
| title_full_unstemmed | Determining Interface Dielectric Losses in Superconducting Coplanar-Waveguide Resonators |
| title_short | Determining Interface Dielectric Losses in Superconducting Coplanar-Waveguide Resonators |
| title_sort | determining interface dielectric losses in superconducting coplanar waveguide resonators |
| url | https://hdl.handle.net/1721.1/134795 |
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