Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes

Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes

© 2019 by the authors. Licensee MDPI, Basel, Switzerland. Atomic force microscopy is a powerful topography imaging method used widely in nanoscale metrology and manipulation. A conventional Atomic Force Microscope (AFM) utilizes an optical lever system typically composed of a laser source, lenses an...

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Bibliographic Details
Main Authors: Xia, Fangzhou, Yang, Chen, Wang, Yi, Youcef-Toumi, Kamal, Reuter, Christoph, Ivanov, Tzvetan, Holz, Mathias, Rangelow, Ivo W
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering
Format: Article
Language:English
Published: MDPI AG 2021
Online Access:https://hdl.handle.net/1721.1/134801

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