Characterization of single layer anti-reflective coatings for bolometer-based rare event searches

© 2017 IOP Publishing Ltd and Sissa Medialab. Combining analysis from phonon signals and photon signals is a powerful technique for reducing backgrounds in bolometer-based rare event searches. Anti-reflective coatings can significantly increase the performance of the secondary light-sensing bolomete...

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Main Authors: Hansen, EV, DePorzio, N, Winslow, L
Other Authors: Massachusetts Institute of Technology. Department of Physics
Format: Article
Language:English
Published: IOP Publishing 2021
Online Access:https://hdl.handle.net/1721.1/136338
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author Hansen, EV
DePorzio, N
Winslow, L
author2 Massachusetts Institute of Technology. Department of Physics
author_facet Massachusetts Institute of Technology. Department of Physics
Hansen, EV
DePorzio, N
Winslow, L
author_sort Hansen, EV
collection MIT
description © 2017 IOP Publishing Ltd and Sissa Medialab. Combining analysis from phonon signals and photon signals is a powerful technique for reducing backgrounds in bolometer-based rare event searches. Anti-reflective coatings can significantly increase the performance of the secondary light-sensing bolometer in these experiments. As a first step toward these improvements, coatings of SiO2, HfO2, and TiO2 on Ge and Si wafers were fabricated and characterized at room temperature and multiple angles of incidence.
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spelling mit-1721.1/1363382023-02-17T17:49:29Z Characterization of single layer anti-reflective coatings for bolometer-based rare event searches Hansen, EV DePorzio, N Winslow, L Massachusetts Institute of Technology. Department of Physics © 2017 IOP Publishing Ltd and Sissa Medialab. Combining analysis from phonon signals and photon signals is a powerful technique for reducing backgrounds in bolometer-based rare event searches. Anti-reflective coatings can significantly increase the performance of the secondary light-sensing bolometer in these experiments. As a first step toward these improvements, coatings of SiO2, HfO2, and TiO2 on Ge and Si wafers were fabricated and characterized at room temperature and multiple angles of incidence. 2021-10-27T20:34:55Z 2021-10-27T20:34:55Z 2017 2019-06-17T21:14:01Z Article http://purl.org/eprint/type/JournalArticle https://hdl.handle.net/1721.1/136338 en 10.1088/1748-0221/12/09/P09018 Journal of Instrumentation Creative Commons Attribution-Noncommercial-Share Alike http://creativecommons.org/licenses/by-nc-sa/4.0/ application/pdf IOP Publishing arXiv
spellingShingle Hansen, EV
DePorzio, N
Winslow, L
Characterization of single layer anti-reflective coatings for bolometer-based rare event searches
title Characterization of single layer anti-reflective coatings for bolometer-based rare event searches
title_full Characterization of single layer anti-reflective coatings for bolometer-based rare event searches
title_fullStr Characterization of single layer anti-reflective coatings for bolometer-based rare event searches
title_full_unstemmed Characterization of single layer anti-reflective coatings for bolometer-based rare event searches
title_short Characterization of single layer anti-reflective coatings for bolometer-based rare event searches
title_sort characterization of single layer anti reflective coatings for bolometer based rare event searches
url https://hdl.handle.net/1721.1/136338
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AT deporzion characterizationofsinglelayerantireflectivecoatingsforbolometerbasedrareeventsearches
AT winslowl characterizationofsinglelayerantireflectivecoatingsforbolometerbasedrareeventsearches