APA (7th ed.) Citation

Laine, H. S., Vahlman, H., Haarahiltunen, A., Jensen, M. A., Modanese, C., Wagner, M., . . . Savin, H. (2021). Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact. Author(s).

Chicago Style (17th ed.) Citation

Laine, Hannu S., Henri Vahlman, Antti Haarahiltunen, Mallory A. Jensen, Chiara Modanese, Matthias Wagner, Franziska Wolny, Tonio Buonassisi, and Hele Savin. Vertically Integrated Modeling of Light-induced Defects: Process Modeling, Degradation Kinetics and Device Impact. Author(s), 2021.

MLA (9th ed.) Citation

Laine, Hannu S., et al. Vertically Integrated Modeling of Light-induced Defects: Process Modeling, Degradation Kinetics and Device Impact. Author(s), 2021.