Determining the depairing current in superconducting nanowire single-photon detectors
We estimate the depairing current of superconducting nanowire single-photon detectors (SNSPDs) by studying the dependence of the nanowires' kinetic inductance on their bias current. The kinetic inductance is determined by measuring the resonance frequency of resonator-style nanowire coplanar wa...
| Main Authors: | , , , , , , , , , , , , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
American Physical Society
2021
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| Online Access: | https://hdl.handle.net/1721.1/136930 |
| _version_ | 1811095945360703488 |
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| author | Frasca, S. Korzh, B. Colangelo, M. Zhu, D. Lita, A. E. Allmaras, J. P. Wollman, E. E. Verma, V. B. Dane, A. E. Ramirez, E. Beyer, A. D. Nam, S. W. Kozorezov, A. G. Shaw, M. D. Berggren, K. K. |
| author2 | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science |
| author_facet | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Frasca, S. Korzh, B. Colangelo, M. Zhu, D. Lita, A. E. Allmaras, J. P. Wollman, E. E. Verma, V. B. Dane, A. E. Ramirez, E. Beyer, A. D. Nam, S. W. Kozorezov, A. G. Shaw, M. D. Berggren, K. K. |
| author_sort | Frasca, S. |
| collection | MIT |
| description | We estimate the depairing current of superconducting nanowire single-photon detectors (SNSPDs) by studying the dependence of the nanowires' kinetic inductance on their bias current. The kinetic inductance is determined by measuring the resonance frequency of resonator-style nanowire coplanar waveguides both in transmission and reflection configurations. Bias current dependent shifts in the measured resonant frequency correspond to the change in the kinetic inductance, which can be compared with theoretical predictions. We demonstrate that the fast relaxation model described in the literature accurately matches our experimental data and provides a valuable tool for determination of the depairing current. Accurate measurement of the depairing current is critical for nanowire quality analysis, as well as modeling efforts aimed at understanding the detection mechanism in SNSPDs. |
| first_indexed | 2024-09-23T16:35:17Z |
| format | Article |
| id | mit-1721.1/136930 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T16:35:17Z |
| publishDate | 2021 |
| publisher | American Physical Society |
| record_format | dspace |
| spelling | mit-1721.1/1369302023-03-24T19:32:50Z Determining the depairing current in superconducting nanowire single-photon detectors Frasca, S. Korzh, B. Colangelo, M. Zhu, D. Lita, A. E. Allmaras, J. P. Wollman, E. E. Verma, V. B. Dane, A. E. Ramirez, E. Beyer, A. D. Nam, S. W. Kozorezov, A. G. Shaw, M. D. Berggren, K. K. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science We estimate the depairing current of superconducting nanowire single-photon detectors (SNSPDs) by studying the dependence of the nanowires' kinetic inductance on their bias current. The kinetic inductance is determined by measuring the resonance frequency of resonator-style nanowire coplanar waveguides both in transmission and reflection configurations. Bias current dependent shifts in the measured resonant frequency correspond to the change in the kinetic inductance, which can be compared with theoretical predictions. We demonstrate that the fast relaxation model described in the literature accurately matches our experimental data and provides a valuable tool for determination of the depairing current. Accurate measurement of the depairing current is critical for nanowire quality analysis, as well as modeling efforts aimed at understanding the detection mechanism in SNSPDs. 2021-11-01T14:35:00Z 2021-11-01T14:35:00Z 2019-08-30 2019-09-05T18:31:59Z Article http://purl.org/eprint/type/JournalArticle https://hdl.handle.net/1721.1/136930 Phys. Rev. B 100, 054520 (2019) PUBLISHER_POLICY PUBLISHER_POLICY en http://dx.doi.org/10.1103/PhysRevB.100.054520 Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. American Physical Society application/pdf American Physical Society American Physical Society |
| spellingShingle | Frasca, S. Korzh, B. Colangelo, M. Zhu, D. Lita, A. E. Allmaras, J. P. Wollman, E. E. Verma, V. B. Dane, A. E. Ramirez, E. Beyer, A. D. Nam, S. W. Kozorezov, A. G. Shaw, M. D. Berggren, K. K. Determining the depairing current in superconducting nanowire single-photon detectors |
| title | Determining the depairing current in superconducting nanowire single-photon detectors |
| title_full | Determining the depairing current in superconducting nanowire single-photon detectors |
| title_fullStr | Determining the depairing current in superconducting nanowire single-photon detectors |
| title_full_unstemmed | Determining the depairing current in superconducting nanowire single-photon detectors |
| title_short | Determining the depairing current in superconducting nanowire single-photon detectors |
| title_sort | determining the depairing current in superconducting nanowire single photon detectors |
| url | https://hdl.handle.net/1721.1/136930 |
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