Proton Radiation Effects Assessment of a Commercial 12-Megapixel CMOS Imager
© 2017 IEEE. Commercial off-the-shelf 12-Megapixel CMOS image sensors were irradiated with 105 MeV protons - one part to a fluence of 4×1011 protons/cm2, and a second part to 2×1011 protons/cm2. Pixel brightness increases with fluence along with annealing effects are reported. No latch-up events or...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
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Institute of Electrical and Electronics Engineers (IEEE)
2021
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| Online Access: | https://hdl.handle.net/1721.1/137914 |
| _version_ | 1826189675860066304 |
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| author | Milanowski, Randall Aniceto, Raichelle Hardy, Fred Vermeire, Bert Jacox, Michael Moro, Slaven Cahoy, Kerri |
| author_facet | Milanowski, Randall Aniceto, Raichelle Hardy, Fred Vermeire, Bert Jacox, Michael Moro, Slaven Cahoy, Kerri |
| author_sort | Milanowski, Randall |
| collection | MIT |
| description | © 2017 IEEE. Commercial off-the-shelf 12-Megapixel CMOS image sensors were irradiated with 105 MeV protons - one part to a fluence of 4×1011 protons/cm2, and a second part to 2×1011 protons/cm2. Pixel brightness increases with fluence along with annealing effects are reported. No latch-up events or hangs occurred. |
| first_indexed | 2024-09-23T08:19:21Z |
| format | Article |
| id | mit-1721.1/137914 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T08:19:21Z |
| publishDate | 2021 |
| publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| record_format | dspace |
| spelling | mit-1721.1/1379142021-11-10T03:47:38Z Proton Radiation Effects Assessment of a Commercial 12-Megapixel CMOS Imager Milanowski, Randall Aniceto, Raichelle Hardy, Fred Vermeire, Bert Jacox, Michael Moro, Slaven Cahoy, Kerri © 2017 IEEE. Commercial off-the-shelf 12-Megapixel CMOS image sensors were irradiated with 105 MeV protons - one part to a fluence of 4×1011 protons/cm2, and a second part to 2×1011 protons/cm2. Pixel brightness increases with fluence along with annealing effects are reported. No latch-up events or hangs occurred. 2021-11-09T15:17:05Z 2021-11-09T15:17:05Z 2017-07 2019-07-29T18:34:05Z Article http://purl.org/eprint/type/ConferencePaper https://hdl.handle.net/1721.1/137914 Milanowski, Randall, Aniceto, Raichelle, Hardy, Fred, Vermeire, Bert, Jacox, Michael et al. 2017. "Proton Radiation Effects Assessment of a Commercial 12-Megapixel CMOS Imager." en 10.1109/nsrec.2017.8115465 Creative Commons Attribution-Noncommercial-Share Alike http://creativecommons.org/licenses/by-nc-sa/4.0/ application/pdf Institute of Electrical and Electronics Engineers (IEEE) Prof. Cahoy via Barbara Williams |
| spellingShingle | Milanowski, Randall Aniceto, Raichelle Hardy, Fred Vermeire, Bert Jacox, Michael Moro, Slaven Cahoy, Kerri Proton Radiation Effects Assessment of a Commercial 12-Megapixel CMOS Imager |
| title | Proton Radiation Effects Assessment of a Commercial 12-Megapixel CMOS Imager |
| title_full | Proton Radiation Effects Assessment of a Commercial 12-Megapixel CMOS Imager |
| title_fullStr | Proton Radiation Effects Assessment of a Commercial 12-Megapixel CMOS Imager |
| title_full_unstemmed | Proton Radiation Effects Assessment of a Commercial 12-Megapixel CMOS Imager |
| title_short | Proton Radiation Effects Assessment of a Commercial 12-Megapixel CMOS Imager |
| title_sort | proton radiation effects assessment of a commercial 12 megapixel cmos imager |
| url | https://hdl.handle.net/1721.1/137914 |
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