Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC
© 2017 IEEE. Experimental assessment of commercial 100/200 Gbps optical coherent DSP modem ASIC completed with 64 MeV and 480 MeV proton radiation test campaigns. Single event effect cross sections calculated and no performance degradation observed for proton fluence levels up to 1.27×1012 p/cm2 wit...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
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Institute of Electrical and Electronics Engineers (IEEE)
2021
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| Online Access: | https://hdl.handle.net/1721.1/137994 |
| _version_ | 1826192289431552000 |
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| author | Aniceto, Raichelle Moro, Slaven Milanowski, Randall Isabelle, Christopher Hall, Norman Vermeire, Bert Cahoy, Kerri |
| author_facet | Aniceto, Raichelle Moro, Slaven Milanowski, Randall Isabelle, Christopher Hall, Norman Vermeire, Bert Cahoy, Kerri |
| author_sort | Aniceto, Raichelle |
| collection | MIT |
| description | © 2017 IEEE. Experimental assessment of commercial 100/200 Gbps optical coherent DSP modem ASIC completed with 64 MeV and 480 MeV proton radiation test campaigns. Single event effect cross sections calculated and no performance degradation observed for proton fluence levels up to 1.27×1012 p/cm2 with equivalent total ionizing dose exposure to 170 krad(Si). |
| first_indexed | 2024-09-23T09:09:12Z |
| format | Article |
| id | mit-1721.1/137994 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T09:09:12Z |
| publishDate | 2021 |
| publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| record_format | dspace |
| spelling | mit-1721.1/1379942021-11-10T03:42:37Z Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC Aniceto, Raichelle Moro, Slaven Milanowski, Randall Isabelle, Christopher Hall, Norman Vermeire, Bert Cahoy, Kerri © 2017 IEEE. Experimental assessment of commercial 100/200 Gbps optical coherent DSP modem ASIC completed with 64 MeV and 480 MeV proton radiation test campaigns. Single event effect cross sections calculated and no performance degradation observed for proton fluence levels up to 1.27×1012 p/cm2 with equivalent total ionizing dose exposure to 170 krad(Si). 2021-11-09T17:39:46Z 2021-11-09T17:39:46Z 2017-07 2019-07-29T18:27:07Z Article http://purl.org/eprint/type/ConferencePaper https://hdl.handle.net/1721.1/137994 Aniceto, Raichelle, Moro, Slaven, Milanowski, Randall, Isabelle, Christopher, Hall, Norman et al. 2017. "Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC." en 10.1109/nsrec.2017.8115466 Creative Commons Attribution-Noncommercial-Share Alike http://creativecommons.org/licenses/by-nc-sa/4.0/ application/pdf Institute of Electrical and Electronics Engineers (IEEE) Prof. Cahoy via Barbara Williams |
| spellingShingle | Aniceto, Raichelle Moro, Slaven Milanowski, Randall Isabelle, Christopher Hall, Norman Vermeire, Bert Cahoy, Kerri Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC |
| title | Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC |
| title_full | Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC |
| title_fullStr | Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC |
| title_full_unstemmed | Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC |
| title_short | Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC |
| title_sort | single event effect and total ionizing dose assessment of commercial optical coherent dsp asic |
| url | https://hdl.handle.net/1721.1/137994 |
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