How Much Physics is in a Current–Voltage Curve? Inferring Defect Properties From Photovoltaic Device Measurements
Defect-assisted recombination processes are critical to understand, as they frequently limit the photovoltaic (PV) device performance. However, the physical parameters governing these processes can be extremely challenging to measure, requiring specialized techniques and sample preparation. And yet...
| Main Authors: | , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Institute of Electrical and Electronics Engineers (IEEE)
2021
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| Online Access: | https://hdl.handle.net/1721.1/138484 |
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