High spatial and temporal resolution synthetic aperture phase microscopy

High spatial and temporal resolution synthetic aperture phase microscopy

A new optical microscopy technique, termed high spatial and temporal resolution synthetic aperture phase microscopy (HISTR-SAPM), is proposed to improve the lateral resolution of wide-field coherent imaging. Under plane wave illumination, the resolution is increased by twofold to around 260 nm, whil...

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Bibliographic Details
Main Authors: Zheng, Cheng, Jin, Di, He, Yanping, Lin, Hongtao, Hu, Juejun, Yaqoob, Zahid, So, Peter TC, Zhou, Renjie
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering
Format: Article
Language:English
Published: SPIE-Intl Soc Optical Eng 2022
Online Access:https://hdl.handle.net/1721.1/139684

Internet

https://hdl.handle.net/1721.1/139684

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