Impact of Oxygen Non‐Stoichiometry on Near‐Ambient Temperature Ionic Mobility in Polaronic Mixed‐Ionic‐Electronic Conducting Thin Films
Enhanced ionic mobility in mixed ionic and electronic conducting solids contributes to improved performance of memristive memory, energy storage and conversion, and catalytic devices. Ionic mobility can be significantly depressed at reduced temperatures, for example, due to defect association and th...
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Language: | English |
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Wiley
2022
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Online Access: | https://hdl.handle.net/1721.1/140221 |
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author | Defferriere, Thomas Kalaev, Dmitri Rupp, Jennifer L. M. Tuller, Harry L. |
author2 | Massachusetts Institute of Technology. Department of Materials Science and Engineering |
author_facet | Massachusetts Institute of Technology. Department of Materials Science and Engineering Defferriere, Thomas Kalaev, Dmitri Rupp, Jennifer L. M. Tuller, Harry L. |
author_sort | Defferriere, Thomas |
collection | MIT |
description | Enhanced ionic mobility in mixed ionic and electronic conducting solids contributes to improved performance of memristive memory, energy storage and conversion, and catalytic devices. Ionic mobility can be significantly depressed at reduced temperatures, for example, due to defect association and therefore needs to be monitored. Measurements of ionic transport in mixed conductors, however, proves to be difficult due to dominant electronic conductivity. This study examines the impact of different levels of quenched-in oxygen deficiency on the oxygen vacancy mobility near room temperature. A praseodymium doped ceria (Pr0.1Ce0.9O2–δ ) film is grown by pulsed laser deposition and annealed in various oxygen partial pressures to modify its oxygen vacancy concentration. Changes in film non-stoichiometry are monitored by tracking the optical absorption related to the oxidation state of Pr ions. A 13-fold increase in ionic mobility at 60 °C for increases in oxygen non-stoichiometry from 0.032 to 0.042 is detected with negligible changes in migration enthalpy and large changes in pre-factor. Several factors potentially contributing to the large pre-factor changes are examined and discussed. Insights into how ionic defect concentration can markedly impact ionic mobility should help in elucidating the origins of variations seen in nanoionic devices. |
first_indexed | 2024-09-23T09:01:11Z |
format | Article |
id | mit-1721.1/140221 |
institution | Massachusetts Institute of Technology |
language | English |
last_indexed | 2024-09-23T09:01:11Z |
publishDate | 2022 |
publisher | Wiley |
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spelling | mit-1721.1/1402212024-05-21T20:07:50Z Impact of Oxygen Non‐Stoichiometry on Near‐Ambient Temperature Ionic Mobility in Polaronic Mixed‐Ionic‐Electronic Conducting Thin Films Defferriere, Thomas Kalaev, Dmitri Rupp, Jennifer L. M. Tuller, Harry L. Massachusetts Institute of Technology. Department of Materials Science and Engineering Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Enhanced ionic mobility in mixed ionic and electronic conducting solids contributes to improved performance of memristive memory, energy storage and conversion, and catalytic devices. Ionic mobility can be significantly depressed at reduced temperatures, for example, due to defect association and therefore needs to be monitored. Measurements of ionic transport in mixed conductors, however, proves to be difficult due to dominant electronic conductivity. This study examines the impact of different levels of quenched-in oxygen deficiency on the oxygen vacancy mobility near room temperature. A praseodymium doped ceria (Pr0.1Ce0.9O2–δ ) film is grown by pulsed laser deposition and annealed in various oxygen partial pressures to modify its oxygen vacancy concentration. Changes in film non-stoichiometry are monitored by tracking the optical absorption related to the oxidation state of Pr ions. A 13-fold increase in ionic mobility at 60 °C for increases in oxygen non-stoichiometry from 0.032 to 0.042 is detected with negligible changes in migration enthalpy and large changes in pre-factor. Several factors potentially contributing to the large pre-factor changes are examined and discussed. Insights into how ionic defect concentration can markedly impact ionic mobility should help in elucidating the origins of variations seen in nanoionic devices. 2022-02-08T16:21:17Z 2022-02-08T16:21:17Z 2021-01-22 2020-12-20 Article http://purl.org/eprint/type/JournalArticle 1616-301X 1616-3028 https://hdl.handle.net/1721.1/140221 Defferriere, T., Kalaev, D., Rupp, J. L. M., Tuller, H. L., Impact of Oxygen Non-Stoichiometry on Near-Ambient Temperature Ionic Mobility in Polaronic Mixed-Ionic-Electronic Conducting Thin Films. Adv. Funct. Mater. 2021, 31, 2005640 en http://dx.doi.org/10.1002/adfm.202005640 Advanced Functional Materials Creative Commons Attribution-Noncommercial-Share Alike http://creativecommons.org/licenses/by-nc-sa/4.0/ application/pdf Wiley Wiley |
spellingShingle | Defferriere, Thomas Kalaev, Dmitri Rupp, Jennifer L. M. Tuller, Harry L. Impact of Oxygen Non‐Stoichiometry on Near‐Ambient Temperature Ionic Mobility in Polaronic Mixed‐Ionic‐Electronic Conducting Thin Films |
title | Impact of Oxygen Non‐Stoichiometry on Near‐Ambient Temperature Ionic Mobility in Polaronic Mixed‐Ionic‐Electronic Conducting Thin Films |
title_full | Impact of Oxygen Non‐Stoichiometry on Near‐Ambient Temperature Ionic Mobility in Polaronic Mixed‐Ionic‐Electronic Conducting Thin Films |
title_fullStr | Impact of Oxygen Non‐Stoichiometry on Near‐Ambient Temperature Ionic Mobility in Polaronic Mixed‐Ionic‐Electronic Conducting Thin Films |
title_full_unstemmed | Impact of Oxygen Non‐Stoichiometry on Near‐Ambient Temperature Ionic Mobility in Polaronic Mixed‐Ionic‐Electronic Conducting Thin Films |
title_short | Impact of Oxygen Non‐Stoichiometry on Near‐Ambient Temperature Ionic Mobility in Polaronic Mixed‐Ionic‐Electronic Conducting Thin Films |
title_sort | impact of oxygen non stoichiometry on near ambient temperature ionic mobility in polaronic mixed ionic electronic conducting thin films |
url | https://hdl.handle.net/1721.1/140221 |
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