Characterization of mechanical properties of microelectronic thin films

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Civil Engineering, 1990.

Bibliographic Details
Main Author: Maseeh, Fariborz
Other Authors: Stephen D. Senturia.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2005
Subjects:
Online Access:http://hdl.handle.net/1721.1/14081
_version_ 1826198282710286336
author Maseeh, Fariborz
author2 Stephen D. Senturia.
author_facet Stephen D. Senturia.
Maseeh, Fariborz
author_sort Maseeh, Fariborz
collection MIT
description Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Civil Engineering, 1990.
first_indexed 2024-09-23T11:02:26Z
format Thesis
id mit-1721.1/14081
institution Massachusetts Institute of Technology
language eng
last_indexed 2024-09-23T11:02:26Z
publishDate 2005
publisher Massachusetts Institute of Technology
record_format dspace
spelling mit-1721.1/140812022-01-21T19:39:37Z Characterization of mechanical properties of microelectronic thin films Maseeh, Fariborz Stephen D. Senturia. Massachusetts Institute of Technology. Dept. of Civil Engineering. Massachusetts Institute of Technology. Department of Civil Engineering Massachusetts Institute of Technology. Department of Civil and Environmental Engineering Civil Engineering. Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Civil Engineering, 1990. Includes bibliographical references (leaves 172-181). by Fariborz Maseeh-Tehrani. Ph.D. 2005-08-10T19:34:11Z 2005-08-10T19:34:11Z 1990 1990 Thesis http://hdl.handle.net/1721.1/14081 23613820 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 196 leaves 9418967 bytes 9418722 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology
spellingShingle Civil Engineering.
Maseeh, Fariborz
Characterization of mechanical properties of microelectronic thin films
title Characterization of mechanical properties of microelectronic thin films
title_full Characterization of mechanical properties of microelectronic thin films
title_fullStr Characterization of mechanical properties of microelectronic thin films
title_full_unstemmed Characterization of mechanical properties of microelectronic thin films
title_short Characterization of mechanical properties of microelectronic thin films
title_sort characterization of mechanical properties of microelectronic thin films
topic Civil Engineering.
url http://hdl.handle.net/1721.1/14081
work_keys_str_mv AT maseehfariborz characterizationofmechanicalpropertiesofmicroelectronicthinfilms