Thin-film chemical expansion of ceria based solid solutions: laser vibrometry study
<jats:title>Abstract</jats:title> <jats:p>The chemical expansion of Pr<jats:sub>0.1</jats:sub>Ce<jats:sub>0.9</jats:sub>O<jats:sub>2–<jats:italic>δ</jats:italic> </jats:sub> (PCO) and CeO<jats:sub...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Walter de Gruyter GmbH
2022
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| Online Access: | https://hdl.handle.net/1721.1/142566 |
| _version_ | 1826216205283753984 |
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| author | Wulfmeier, Hendrik Kohlmann, Dhyan Defferriere, Thomas Steiner, Carsten Moos, Ralf Tuller, Harry L Fritze, Holger |
| author_facet | Wulfmeier, Hendrik Kohlmann, Dhyan Defferriere, Thomas Steiner, Carsten Moos, Ralf Tuller, Harry L Fritze, Holger |
| author_sort | Wulfmeier, Hendrik |
| collection | MIT |
| description | <jats:title>Abstract</jats:title>
<jats:p>The chemical expansion of Pr<jats:sub>0.1</jats:sub>Ce<jats:sub>0.9</jats:sub>O<jats:sub>2–<jats:italic>δ</jats:italic>
</jats:sub> (PCO) and CeO<jats:sub>2–<jats:italic>δ</jats:italic>
</jats:sub> thin films is investigated in the temperature range between 600 °C and 800 °C by laser Doppler vibrometry (LDV). It enables non-contact determination of nanometer scale changes in film thickness at high temperatures. The present study is the first systematic and detailed investigation of chemical expansion of doped and undoped ceria thin films at temperatures above 650 °C. The thin films were deposited on yttria stabilized zirconia substrates (YSZ), operated as an electrochemical oxygen pump, to periodically adjust the oxygen activity in the films, leading to reversible expansion and contraction of the film. This further leads to stresses in the underlying YSZ substrates, accompanied by bending of the overall devices. Film thickness changes and sample bending are found to reach up to 10 and several hundred nanometers, respectively, at excitation frequencies from 0.1 to 10 Hz and applied voltages from 0–0.75 V for PCO and 0–1 V for ceria. At low frequencies, equilibrium conditions are approached. As a consequence maximum thin-film expansion of PCO is expected due to full reduction of the Pr ions. The lower detection limit for displacements is found to be in the subnanometer range. At 800 °C and an excitation frequency of 1 Hz, the LDV shows a remarkable resolution of 0.3 nm which allows, for example, the characterization of materials with small levels of expansion, such as undoped ceria at high oxygen partial pressure. As the correlation between film expansion and sample bending is obtained through this study, a dimensional change of a free body consisting of the same material can be calculated using the high resolution characteristics of this system. A minimum detectable dimensional change of 5 pm is estimated even under challenging high-temperature conditions at 800 °C opening up opportunities to investigate electro-chemo-mechanical phenomena heretofore impossible to investigate. The expansion data are correlated with previous results on the oxygen nonstoichiometry of PCO thin films, and a defect model for bulk ceria solid solutions is adopted to calculate the cation and anion radii changes in the constrained films during chemical expansion. The constrained films exhibit anisotropic volume expansion with displacements perpendicular to the substrate plane nearly double that of bulk samples. The PCO films used here generate high total displacements of several 100 nm’s with high reproducibility. Consequently, PCO films are identified to be a potential core component of high-temperature actuators. They benefit not only from high displacements at temperatures where most piezoelectric materials no longer operate while exhibiting, low voltage operation and low energy consumption.</jats:p> |
| first_indexed | 2024-09-23T16:43:59Z |
| format | Article |
| id | mit-1721.1/142566 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T16:43:59Z |
| publishDate | 2022 |
| publisher | Walter de Gruyter GmbH |
| record_format | dspace |
| spelling | mit-1721.1/1425662022-05-18T03:01:10Z Thin-film chemical expansion of ceria based solid solutions: laser vibrometry study Wulfmeier, Hendrik Kohlmann, Dhyan Defferriere, Thomas Steiner, Carsten Moos, Ralf Tuller, Harry L Fritze, Holger <jats:title>Abstract</jats:title> <jats:p>The chemical expansion of Pr<jats:sub>0.1</jats:sub>Ce<jats:sub>0.9</jats:sub>O<jats:sub>2–<jats:italic>δ</jats:italic> </jats:sub> (PCO) and CeO<jats:sub>2–<jats:italic>δ</jats:italic> </jats:sub> thin films is investigated in the temperature range between 600 °C and 800 °C by laser Doppler vibrometry (LDV). It enables non-contact determination of nanometer scale changes in film thickness at high temperatures. The present study is the first systematic and detailed investigation of chemical expansion of doped and undoped ceria thin films at temperatures above 650 °C. The thin films were deposited on yttria stabilized zirconia substrates (YSZ), operated as an electrochemical oxygen pump, to periodically adjust the oxygen activity in the films, leading to reversible expansion and contraction of the film. This further leads to stresses in the underlying YSZ substrates, accompanied by bending of the overall devices. Film thickness changes and sample bending are found to reach up to 10 and several hundred nanometers, respectively, at excitation frequencies from 0.1 to 10 Hz and applied voltages from 0–0.75 V for PCO and 0–1 V for ceria. At low frequencies, equilibrium conditions are approached. As a consequence maximum thin-film expansion of PCO is expected due to full reduction of the Pr ions. The lower detection limit for displacements is found to be in the subnanometer range. At 800 °C and an excitation frequency of 1 Hz, the LDV shows a remarkable resolution of 0.3 nm which allows, for example, the characterization of materials with small levels of expansion, such as undoped ceria at high oxygen partial pressure. As the correlation between film expansion and sample bending is obtained through this study, a dimensional change of a free body consisting of the same material can be calculated using the high resolution characteristics of this system. A minimum detectable dimensional change of 5 pm is estimated even under challenging high-temperature conditions at 800 °C opening up opportunities to investigate electro-chemo-mechanical phenomena heretofore impossible to investigate. The expansion data are correlated with previous results on the oxygen nonstoichiometry of PCO thin films, and a defect model for bulk ceria solid solutions is adopted to calculate the cation and anion radii changes in the constrained films during chemical expansion. The constrained films exhibit anisotropic volume expansion with displacements perpendicular to the substrate plane nearly double that of bulk samples. The PCO films used here generate high total displacements of several 100 nm’s with high reproducibility. Consequently, PCO films are identified to be a potential core component of high-temperature actuators. They benefit not only from high displacements at temperatures where most piezoelectric materials no longer operate while exhibiting, low voltage operation and low energy consumption.</jats:p> 2022-05-17T15:11:39Z 2022-05-17T15:11:39Z 2021 2022-05-17T14:28:25Z Article http://purl.org/eprint/type/JournalArticle https://hdl.handle.net/1721.1/142566 Wulfmeier, Hendrik, Kohlmann, Dhyan, Defferriere, Thomas, Steiner, Carsten, Moos, Ralf et al. 2021. "Thin-film chemical expansion of ceria based solid solutions: laser vibrometry study." Zeitschrift für Physikalische Chemie, 0 (0). en 10.1515/ZPCH-2021-3125 Zeitschrift für Physikalische Chemie Creative Commons Attribution 4.0 International License https://creativecommons.org/licenses/by/4.0 application/pdf Walter de Gruyter GmbH de Gruyter |
| spellingShingle | Wulfmeier, Hendrik Kohlmann, Dhyan Defferriere, Thomas Steiner, Carsten Moos, Ralf Tuller, Harry L Fritze, Holger Thin-film chemical expansion of ceria based solid solutions: laser vibrometry study |
| title | Thin-film chemical expansion of ceria based solid solutions: laser vibrometry study |
| title_full | Thin-film chemical expansion of ceria based solid solutions: laser vibrometry study |
| title_fullStr | Thin-film chemical expansion of ceria based solid solutions: laser vibrometry study |
| title_full_unstemmed | Thin-film chemical expansion of ceria based solid solutions: laser vibrometry study |
| title_short | Thin-film chemical expansion of ceria based solid solutions: laser vibrometry study |
| title_sort | thin film chemical expansion of ceria based solid solutions laser vibrometry study |
| url | https://hdl.handle.net/1721.1/142566 |
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